Tristan A. Robinson

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Long data record analysis
- Patent number 8,131,489
- Issue date Mar 6, 2012
- Tektronix, Inc.
- Patricia A. Heuser
- G01 - MEASURING TESTING
Information Patent Grant
Method of processing waveform data from one or more channels using...
- Patent number 8,055,464
- Issue date Nov 8, 2011
- Tektronix, Inc.
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for visually indicating mask violation locations
- Patent number 7,652,667
- Issue date Jan 26, 2010
- Tektronix, Inc.
- Tristan A. Robinson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF PROCESSING WAVEFORM DATA FROM ONE OR MORE CHANNELS USING...
- Publication number 20100063760
- Publication date Mar 11, 2010
- Tektronix, Inc.
- Keith D. RULE
- G01 - MEASURING TESTING
Information Patent Application
Long data record analysis
- Publication number 20080147342
- Publication date Jun 19, 2008
- Patricia A. Heuser
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for visually indicating mask violation locations
- Publication number 20060055709
- Publication date Mar 16, 2006
- Tristan A. Robinson
- G01 - MEASURING TESTING
Information Patent Application
Digital oscilloscope with customizable display for selected functio...
- Publication number 20050102115
- Publication date May 12, 2005
- Gary J. Waldo
- G01 - MEASURING TESTING