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Troy Daniel Ribaudo
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Portland, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Optical metrology device using numerical aperture reduction
Patent number
11,162,897
Issue date
Nov 2, 2021
Onto Innovation Inc.
George Andrew Antonelli
G01 - MEASURING TESTING
Information
Patent Grant
Optical metrology system using infrared wavelengths
Patent number
10,901,241
Issue date
Jan 26, 2021
Onto Innovation Inc.
George Andrew Antonelli
G01 - MEASURING TESTING
Information
Patent Grant
Light source failure identification in an optical metrology device
Patent number
10,775,149
Issue date
Sep 15, 2020
Onto Innovation Inc.
George Andrew Antonelli
G01 - MEASURING TESTING
Information
Patent Grant
Clean resistant windows for ultraviolet thermal processing
Patent number
10,240,236
Issue date
Mar 26, 2019
Lam Research Corporation
James Lee
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Highly directional thermal emitter
Patent number
8,987,754
Issue date
Mar 24, 2015
Sandia Corporation
Troy Ribaudo
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL METROLOGY DEVICE USING NUMERICAL APERTURE REDUCTION
Publication number
20200363332
Publication date
Nov 19, 2020
ONTO INNOVATION INC.
George Andrew Antonelli
G01 - MEASURING TESTING
Information
Patent Application
CLEAN RESISTANT WINDOWS FOR ULTRAVIOLET THERMAL PROCESSING
Publication number
20160258057
Publication date
Sep 8, 2016
LAM RESEARCH CORPORATION
James Lee
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
LOW-K DIELECTRIC FILM FORMATION
Publication number
20160042943
Publication date
Feb 11, 2016
LAM RESEARCH CORPORATION
Troy Daniel Ribaudo
H01 - BASIC ELECTRIC ELEMENTS