Troy J. Perry

Person

Georgia, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Pre-test power-optimized bin reassignment following selective volta...
- Patent number 10,295,592
- Issue date May 21, 2019
- Global Foundries Inc.
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pre-test power-optimized bin reassignment following selective volta...
- Patent number 9,759,767
- Issue date Sep 12, 2017
- GLOBALFOUNDRIES Inc.
- Igor Arsovski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Threshold voltage (VT)-type transistor sensitive and/or fan-out sen...
- Patent number 9,653,330
- Issue date May 16, 2017
- GLOBALFOUNDRIES Inc.
- Jeanne P. Bickford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for semiconductor line scribe line centering
- Patent number 9,514,999
- Issue date Dec 6, 2016
- GLOBALFOUNDRIES Inc.
- Jeanne P. Bickford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thermally adaptive in-system allocation
- Patent number 8,963,566
- Issue date Feb 24, 2015
- Intenational Business Machines Corporation
- John R. Goss
- G01 - MEASURING TESTING
Information Patent Grant
Selectable repair pass masking
- Patent number 8,570,820
- Issue date Oct 29, 2013
- International Business Machines Corporation
- Kevin William Gorman
- G11 - INFORMATION STORAGE
Information Patent Grant
HDL design structure for integrating test structures into an integr...
- Patent number 7,884,599
- Issue date Feb 8, 2011
- International Business Machines Corporation
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Grant
Design structure for providing optimal field programming of electro...
- Patent number 7,791,972
- Issue date Sep 7, 2010
- International Business Machines Corporation
- Michael R. Ouelette
- G11 - INFORMATION STORAGE
Information Patent Grant
System for and method of integrating test structures into an integr...
- Patent number 7,653,888
- Issue date Jan 26, 2010
- International Business Machines Corporation
- Nazmul Habib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of providing optimal field programming of electronic fuses
- Patent number 7,518,899
- Issue date Apr 14, 2009
- International Business Machines Corporation
- Troy J. Perry
- G11 - INFORMATION STORAGE
Information Patent Grant
Embedded test circuit for testing integrated circuits at the die level
- Patent number 7,512,915
- Issue date Mar 31, 2009
- International Business Machines Corporation
- Darren Anand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for acquiring device parameters
- Patent number 7,382,149
- Issue date Jun 3, 2008
- International Business Machines Corporation
- Darren L. Anand
- G01 - MEASURING TESTING
Information Patent Grant
Electronic fuse blow mimic and methods for adjusting electronic fus...
- Patent number 7,170,299
- Issue date Jan 30, 2007
- International Business Machines Corporation
- Darren L. Anand
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
PRE-TEST POWER-OPTIMIZED BIN REASSIGNMENT FOLLOWING SELECTIVE VOLTA...
- Publication number 20170276726
- Publication date Sep 28, 2017
- GLOBALFOUNDRIES INC.
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Application
PRE-TEST POWER-OPTIMIZED BIN REASSIGNMENT FOLLOWING SELECTIVE VOLTA...
- Publication number 20160313394
- Publication date Oct 27, 2016
- International Business Machines Corporation
- Igor Arsovski
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR LINE SCRIBE CENTERING
- Publication number 20140188265
- Publication date Jul 3, 2014
- International Business Machines Corporation
- Jeanne P. BICKFORD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THERMALLY ADAPTIVE IN-SYSTEM ALLOCATION
- Publication number 20140097860
- Publication date Apr 10, 2014
- International Business Machines Corporation
- John R. Goss
- G01 - MEASURING TESTING
Information Patent Application
SELECTABLE REPAIR PASS MASKING
- Publication number 20120230136
- Publication date Sep 13, 2012
- International Business Machines Corporation
- Kevin William Gorman
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM FOR AND METHOD OF INTEGRATING TEST STRUCTURES INTO AN INTEGR...
- Publication number 20090083690
- Publication date Mar 26, 2009
- Nazmul Habib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System for and Method of Integrating Test Structures into an Integr...
- Publication number 20080270954
- Publication date Oct 30, 2008
- Nazmul Habib
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Embedded Test Circuit For Testing Integrated Circuits At The Die Level
- Publication number 20080270951
- Publication date Oct 30, 2008
- Darren Anand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method in a Computer-aided Design System for Generating a Functiona...
- Publication number 20080222584
- Publication date Sep 11, 2008
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Application
HDL Design Structure for Integrating Test Structures into an Integr...
- Publication number 20080189671
- Publication date Aug 7, 2008
- Nazmul Habib
- G01 - MEASURING TESTING
Information Patent Application
Method Of Providing Optimal Field Programming Of Electronic Fuses
- Publication number 20080101145
- Publication date May 1, 2008
- International Business Machines Corporation
- Troy J. Perry
- G11 - INFORMATION STORAGE
Information Patent Application
DESIGN STRUCTURE FOR PROVIDING OPTIMAL FIELD PROGRAMMING OF ELECTRO...
- Publication number 20080104551
- Publication date May 1, 2008
- International Business Machines Corporation
- Michael R. Ouellette
- G11 - INFORMATION STORAGE
Information Patent Application
A SYSTEM FOR ACQUIRING DEVICE PARAMETERS
- Publication number 20080018356
- Publication date Jan 24, 2008
- Darren L Anand
- G01 - MEASURING TESTING

Troy J. Perry

Person

Patents Grantslast 30 patents

Pre-test power-optimized bin reassignment following selective volta...

Pre-test power-optimized bin reassignment following selective volta...

Threshold voltage (VT)-type transistor sensitive and/or fan-out sen...

Systems and methods for semiconductor line scribe line centering

Thermally adaptive in-system allocation

Selectable repair pass masking

HDL design structure for integrating test structures into an integr...

Design structure for providing optimal field programming of electro...

System for and method of integrating test structures into an integr...

Method of providing optimal field programming of electronic fuses

Embedded test circuit for testing integrated circuits at the die level

System for acquiring device parameters

Electronic fuse blow mimic and methods for adjusting electronic fus...

Patents Applicationslast 30 patents

PRE-TEST POWER-OPTIMIZED BIN REASSIGNMENT FOLLOWING SELECTIVE VOLTA...

PRE-TEST POWER-OPTIMIZED BIN REASSIGNMENT FOLLOWING SELECTIVE VOLTA...

SYSTEMS AND METHODS FOR SEMICONDUCTOR LINE SCRIBE CENTERING

THERMALLY ADAPTIVE IN-SYSTEM ALLOCATION

SELECTABLE REPAIR PASS MASKING

SYSTEM FOR AND METHOD OF INTEGRATING TEST STRUCTURES INTO AN INTEGR...

System for and Method of Integrating Test Structures into an Integr...

Embedded Test Circuit For Testing Integrated Circuits At The Die Level

Method in a Computer-aided Design System for Generating a Functiona...

HDL Design Structure for Integrating Test Structures into an Integr...

Method Of Providing Optimal Field Programming Of Electronic Fuses

DESIGN STRUCTURE FOR PROVIDING OPTIMAL FIELD PROGRAMMING OF ELECTRO...

A SYSTEM FOR ACQUIRING DEVICE PARAMETERS