Troy R. Sorensen

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Devices including stair step structures adjacent substantially plan...
- Patent number 11,508,742
- Issue date Nov 22, 2022
- Micron Technology, Inc.
- Troy R. Sorensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming a semiconductor device structure including a sta...
- Patent number 10,504,838
- Issue date Dec 10, 2019
- Micron Technology, Inc.
- Troy R. Sorensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Arrays of recessed access devices, methods of forming recessed acce...
- Patent number 9,385,132
- Issue date Jul 5, 2016
- Micron Technology, Inc.
- Lars P. Heineck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation structures for preventing photons and carriers from reach...
- Patent number 8,071,455
- Issue date Dec 6, 2011
- Aptina Imaging Corporation
- Bryan G. Cole
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation structures for preventing photons and carriers from reach...
- Patent number 7,534,691
- Issue date May 19, 2009
- Aptina Imaging Corporation
- Bryan G. Cole
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation structures for preventing photons and carriers from reach...
- Patent number 7,400,004
- Issue date Jul 15, 2008
- Micron Technology, Inc.
- Bryan G. Cole
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation structures for preventing photons and carriers from reach...
- Patent number 7,154,136
- Issue date Dec 26, 2006
- Micron Technology, Inc.
- Bryan G. Cole
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for analyzing a semiconductor surface
- Patent number 6,749,715
- Issue date Jun 15, 2004
- Micron Technology, Inc.
- Terry L. Gilton
- G01 - MEASURING TESTING
Information Patent Grant
System and method for analyzing a semiconductor surface
- Patent number 6,602,795
- Issue date Aug 5, 2003
- Micron Technology, Inc.
- Terry L. Gilton
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing a semiconductor surface
- Patent number 6,519,031
- Issue date Feb 11, 2003
- Micron Technology, Inc.
- Terry L. Gilton
- G01 - MEASURING TESTING
Information Patent Grant
System and method for analyzing a semiconductor surface
- Patent number 6,420,275
- Issue date Jul 16, 2002
- Micron Technology, Inc.
- Terry L. Gilton
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for removing noble metal contamination from liquids
- Patent number 6,365,042
- Issue date Apr 2, 2002
- Micron Technology, Inc.
- Troy Sorensen
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Method for gettering noble metals from mineral acid solution
- Patent number 5,691,211
- Issue date Nov 25, 1997
- Micron Technology, Inc.
- Troy Sorensen
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Method for gettering noble metals from mineral acid solution
- Patent number 5,501,767
- Issue date Mar 26, 1996
- Micron Technology, Inc.
- Troy Sorensen
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...

Patents Applicationslast 30 patents

Information Patent Application
DEVICES INCLUDING A STAIR STEP STRUCTURE ADJACENT A SUBSTANTIALLY P...
- Publication number 20230077163
- Publication date Mar 9, 2023
- Micron Technology, Inc.
- Troy R. Sorensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES INCLUDING STAIR STEP STRUCTURES
- Publication number 20200118919
- Publication date Apr 16, 2020
- Micron Technology, Inc.
- Troy R. Sorensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING A SEMICONDUCTOR DEVICE STRUCTURE INCLUDING A STA...
- Publication number 20180082940
- Publication date Mar 22, 2018
- Micron Technology, Inc.
- Troy R. Sorensen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Arrays Of Recessed Access Devices, Methods Of Forming Recessed Acce...
- Publication number 20130049072
- Publication date Feb 28, 2013
- Lars P. Heineck
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOLATION STRUCTURES FOR PREVENTING PHOTONS AND CARRIERS FROM REACH...
- Publication number 20090243021
- Publication date Oct 1, 2009
- Bryan G. Cole
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Isolation structures for preventing photons and carriers from reach...
- Publication number 20060286766
- Publication date Dec 21, 2006
- Bryan G. Cole
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Isolation structures for preventing photons and carriers from reach...
- Publication number 20060220069
- Publication date Oct 5, 2006
- Bryan G. Cole
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Isolation structures for preventing photons and carriers from reach...
- Publication number 20050184291
- Publication date Aug 25, 2005
- Bryan G. Cole
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to filter EM radiation of certain energies using poly silicon
- Publication number 20050057671
- Publication date Mar 17, 2005
- Bryan G. Cole
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and method for analyzing a semiconductor surface
- Publication number 20020182883
- Publication date Dec 5, 2002
- Terry L. Gilton
- G01 - MEASURING TESTING
Information Patent Application
Method for analyzing a semiconductor surface
- Publication number 20020004312
- Publication date Jan 10, 2002
- Terry L. Gilton
- G01 - MEASURING TESTING
Information Patent Application
System and method for analyzing a semiconductor surface
- Publication number 20010023130
- Publication date Sep 20, 2001
- Terry L. Gilton
- G01 - MEASURING TESTING

Troy R. Sorensen

Person

Patents Grantslast 30 patents

Devices including stair step structures adjacent substantially plan...

Methods of forming a semiconductor device structure including a sta...

Arrays of recessed access devices, methods of forming recessed acce...

Isolation structures for preventing photons and carriers from reach...

Isolation structures for preventing photons and carriers from reach...

Isolation structures for preventing photons and carriers from reach...

Isolation structures for preventing photons and carriers from reach...

System and method for analyzing a semiconductor surface

System and method for analyzing a semiconductor surface

Method for analyzing a semiconductor surface

System and method for analyzing a semiconductor surface

Apparatus for removing noble metal contamination from liquids

Method for gettering noble metals from mineral acid solution

Method for gettering noble metals from mineral acid solution

Patents Applicationslast 30 patents

DEVICES INCLUDING A STAIR STEP STRUCTURE ADJACENT A SUBSTANTIALLY P...

DEVICES INCLUDING STAIR STEP STRUCTURES

METHODS OF FORMING A SEMICONDUCTOR DEVICE STRUCTURE INCLUDING A STA...

Arrays Of Recessed Access Devices, Methods Of Forming Recessed Acce...

ISOLATION STRUCTURES FOR PREVENTING PHOTONS AND CARRIERS FROM REACH...

Isolation structures for preventing photons and carriers from reach...

Isolation structures for preventing photons and carriers from reach...

Isolation structures for preventing photons and carriers from reach...

Method to filter EM radiation of certain energies using poly silicon

System and method for analyzing a semiconductor surface

Method for analyzing a semiconductor surface

System and method for analyzing a semiconductor surface