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Trudo CLARYSSE
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Leuven, BE
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Patents Grants
last 30 patents
Information
Patent Grant
Method for determining the active doping concentration of a doped s...
Patent number
8,717,570
Issue date
May 6, 2014
IMEC
Janusz Bogdanowicz
G01 - MEASURING TESTING
Information
Patent Grant
Junction-photovoltage method and apparatus for contactless determin...
Patent number
8,364,428
Issue date
Jan 29, 2013
IMEC
Frederic Schaus
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for the independent extraction of carrier concent...
Patent number
8,314,628
Issue date
Nov 20, 2012
IMEC
Trudo Clarysse
G01 - MEASURING TESTING
Information
Patent Grant
Method and device to quantify active carrier profiles in ultra-shal...
Patent number
7,751,035
Issue date
Jul 6, 2010
IMEC
Trudo Clarysse
G01 - MEASURING TESTING
Information
Patent Grant
System and method for measuring properties of a semiconductor subst...
Patent number
7,133,128
Issue date
Nov 7, 2006
Interuniversitair Microelektronica Centrum (IMEC) VZW
Trudo Clarysse
G01 - MEASURING TESTING
Information
Patent Grant
Database and method for measurement correction for cross-sectional...
Patent number
5,995,912
Issue date
Nov 30, 1999
IMEC vzw
Peter DeWolf
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR DETERMINING THE ACTIVE DOPING CONCENTRATION OF A DOPED S...
Publication number
20130155409
Publication date
Jun 20, 2013
Katholieke Universiteit Leuven
Janusz BOGDANOWICZ
G01 - MEASURING TESTING
Information
Patent Application
JUNCTION-PHOTOVOLTAGE METHOD AND APPARATUS FOR CONTACTLESS DETERMIN...
Publication number
20100153033
Publication date
Jun 17, 2010
IMEC
Frederic Schaus
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE TO QUANTIFY ACTIVE CARRIER PROFILES IN ULTRA-SHAL...
Publication number
20080224036
Publication date
Sep 18, 2008
Interuniversitair Microelektronica Centrum vzw (IMEC)
Trudo Clarysse
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR THE INDEPENDENT EXTRACTION OF CARRIER CONCENT...
Publication number
20070292976
Publication date
Dec 20, 2007
Interuniversitair Microelektronica Centrum vzw (IMEC)
Trudo Clarysse
G01 - MEASURING TESTING
Information
Patent Application
System and method for measuring properties of a semiconductor subst...
Publication number
20040064263
Publication date
Apr 1, 2004
Trudo Clarysse
G01 - MEASURING TESTING