Tsan-Hsiung Lai

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Hsin Chu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method of integration testing for packaged electronic components
- Patent number 7,163,829
- Issue date Jan 16, 2007
- Youngtek Electronics Corporation
- Kuei-Pao Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Mass-production LED test device for mass production
- Publication number 20060226848
- Publication date Oct 12, 2006
- Youngtek Electronics Corporation
- Tsan-Hsiung Lai
- G01 - MEASURING TESTING
Information Patent Application
Method of integration testing for packaged electronic components
- Publication number 20060166380
- Publication date Jul 27, 2006
- Youngtek Electronics Corporation
- Kuei-Pao Chen
- G01 - MEASURING TESTING