Tse-Hsiao LIU

Person

Hsinchu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Memory-control circuit and method for controlling erasing operation...
- Patent number 12,154,631
- Issue date Nov 26, 2024
- Nuvoton Technology Corporation
- Tse-Yen Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Secure memory device and erase method thereof
- Patent number 11,942,161
- Issue date Mar 26, 2024
- Nuvoton Technology Corporation
- Tse-Yen Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Data-receiving circuit of infrared receiver and data-receiving meth...
- Patent number 11,424,826
- Issue date Aug 23, 2022
- Nuvoton Technology Corporation
- Tse-Yen Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor structure and method for forming the same
- Patent number 11,387,361
- Issue date Jul 12, 2022
- Vanguard International Semiconductor Corporation
- Chin-Hsiu Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal synchronizing device and digital signal output device
- Patent number 11,310,025
- Issue date Apr 19, 2022
- Nuvoton Technology Corporation
- Tse-Yen Liu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device and method for manufacturing the same
- Patent number 9,978,864
- Issue date May 22, 2018
- Vanguard International Semiconductor Corporation
- Tse-Hsiao Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a silicon oxide layer
- Patent number 6,566,282
- Issue date May 20, 2003
- United Microelectronics Corp.
- Cheng-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of increasing selectivity in silicon nitride deposition
- Patent number 6,383,946
- Issue date May 7, 2002
- United Microelectronics Corp.
- Tzung-Hua Ying
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of fabricating capacitor dielectric
- Patent number 6,350,707
- Issue date Feb 26, 2002
- United Microelectronics Corp.
- Tse-Wei Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for cleaning a semiconductor wafer
- Patent number 6,165,279
- Issue date Dec 26, 2000
- United Silicon Incorporated
- Li-Wu Tsao
- C11 - ANIMAL AND VEGETABLE OILS, FATS, FATTY SUBSTANCES AND WAXES FATTY ACIDS...
Information Patent Grant
Method of inspecting wafer water mark
- Patent number 6,046,061
- Issue date Apr 4, 2000
- United Silicon Incorporated
- Li-Wu Tsao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MECHANISM CAPABLE OF PERFORMING ON-CHIP TEST AND VERIFICATION
- Publication number 20240310436
- Publication date Sep 19, 2024
- SILICON MOTION, INC.
- Tse-Yen Liu
- G01 - MEASURING TESTING
Information Patent Application
SECURE MEMORY DEVICE AND ERASE METHOD THEREOF
- Publication number 20230162800
- Publication date May 25, 2023
- NUVOTON TECHNOLOGY CORPORATION
- Tse-Yen LIU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY-CONTROL CIRCUIT AND METHOD FOR CONTROLLING ERASING OPERATION...
- Publication number 20220415405
- Publication date Dec 29, 2022
- Nuvoton Technology Corporation
- Tse-Yen LIU
- G11 - INFORMATION STORAGE
Information Patent Application
DATA-RECEIVING CIRCUIT OF INFRARED RECEIVER AND DATA-RECEIVING METH...
- Publication number 20220045752
- Publication date Feb 10, 2022
- Nuvoton Technology Corporation
- Tse-Yen LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME
- Publication number 20210249536
- Publication date Aug 12, 2021
- Vanguard International Semiconductor Corporation
- Chin-Hsiu HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20170162691
- Publication date Jun 8, 2017
- Vanguard International Semiconductor Corporation
- Tse-Hsiao LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR DETECTING AND LOCATING TRAPPED PEOPLE
- Publication number 20150346316
- Publication date Dec 3, 2015
- National Taiwan University of Science and Technology
- Ray-Guang Cheng
- G01 - MEASURING TESTING
Information Patent Application
Method of forming a silicon oxide layer
- Publication number 20020197888
- Publication date Dec 26, 2002
- Cheng-Chieh Huang
- H01 - BASIC ELECTRIC ELEMENTS

Tse-Hsiao LIU

Person

Patents Grantslast 30 patents

Memory-control circuit and method for controlling erasing operation...

Secure memory device and erase method thereof

Data-receiving circuit of infrared receiver and data-receiving meth...

Semiconductor structure and method for forming the same

Signal synchronizing device and digital signal output device

Semiconductor device and method for manufacturing the same

Method of forming a silicon oxide layer

Method of increasing selectivity in silicon nitride deposition

Method of fabricating capacitor dielectric

Method for cleaning a semiconductor wafer

Method of inspecting wafer water mark

Patents Applicationslast 30 patents

MECHANISM CAPABLE OF PERFORMING ON-CHIP TEST AND VERIFICATION

SECURE MEMORY DEVICE AND ERASE METHOD THEREOF

MEMORY-CONTROL CIRCUIT AND METHOD FOR CONTROLLING ERASING OPERATION...

DATA-RECEIVING CIRCUIT OF INFRARED RECEIVER AND DATA-RECEIVING METH...

SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

METHOD AND SYSTEM FOR DETECTING AND LOCATING TRAPPED PEOPLE

Method of forming a silicon oxide layer