TSE-KUN CHEN

Follow

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic component handling device and electronic component testi...
- Patent number 11,372,021
- Issue date Jun 28, 2022
- Advantest Corporation
- Takatoshi Yoshino
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC COMPONENT HANDLING DEVICE AND ELECTRONIC COMPONENT TESTI...
- Publication number 20200241040
- Publication date Jul 30, 2020
- Advantest Corporation
- Takatoshi Yoshino
- G01 - MEASURING TESTING
Information Patent Application
DEVICE UNDER TEST TEMPERATURE SYNCHRONIZED WITH TEST PATTERN
- Publication number 20190086468
- Publication date Mar 21, 2019
- Advantest Corporation
- TAKATOSHI YOSHINO
- G01 - MEASURING TESTING