TSE YU CHENG

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TAOYUAN CITY, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing semiconductor dies and test structure
- Patent number 11,726,138
- Issue date Aug 15, 2023
- NANYA TECHNOLOGY CORPORATION
- Tse Yu Cheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR TESTING SEMICONDUCTOR DIES AND TEST STRUCTURE
- Publication number 20230194596
- Publication date Jun 22, 2023
- NANYA TECHNOLOGY CORPORATION
- Tse Yu CHENG
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTING A LIGHT IRRADIATING ANGLE
- Publication number 20230194338
- Publication date Jun 22, 2023
- National Yang Ming Chiao Tung University
- MANG OU-YANG
- G01 - MEASURING TESTING