Tso-Hui Ting

Person

Hopewell Junction, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
LCR test circuit structure for detecting metal gate defect conditions
- Patent number 9,780,007
- Issue date Oct 3, 2017
- GLOBALFOUNDRIES Inc.
- Xu Ouyang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor wafer probing system including pressure sensing and c...
- Patent number 9,702,930
- Issue date Jul 11, 2017
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Configurable interposer
- Patent number 9,524,930
- Issue date Dec 20, 2016
- International Business Machines Corporation
- Oleg Gluschenkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pressure sensing and control for semiconductor wafer probing
- Patent number 9,354,252
- Issue date May 31, 2016
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Yield enhancement for stacked chips through rotationally-connecting...
- Patent number 9,151,781
- Issue date Oct 6, 2015
- International Business Machines Corporation
- Oleg Gluschenkov
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensing and control for semiconductor wafer probing
- Patent number 8,963,567
- Issue date Feb 24, 2015
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Configurable interposer
- Patent number 8,759,152
- Issue date Jun 24, 2014
- International Business Machines Corporation
- Oleg Gluschenkov
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Noncontact electrical testing with optical techniques
- Patent number 8,742,782
- Issue date Jun 3, 2014
- International Business Machines Corporation
- Xu Ouyang
- G01 - MEASURING TESTING
Information Patent Grant
Wafer alignment system with optical coherence tomography
- Patent number 8,489,225
- Issue date Jul 16, 2013
- International Business Machines Corporation
- Yongchun Xin
- G01 - MEASURING TESTING
Information Patent Grant
Security control of analysis results
- Patent number 8,429,193
- Issue date Apr 23, 2013
- International Business Machines Corporation
- Yunsheng Song
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
In-line characterization of a device under test
- Patent number 8,299,809
- Issue date Oct 30, 2012
- International Business Machines Corporation
- Tso-Hui Ting
- G01 - MEASURING TESTING
Information Patent Grant
Configurable interposer
- Patent number 8,237,278
- Issue date Aug 7, 2012
- International Business Machines Corporation
- Oleg Gluschenkov
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Yield enhancement for stacked chips through rotationally-connecting...
- Patent number 8,159,247
- Issue date Apr 17, 2012
- International Business Machines Corporation
- Oleg Gluschenkov
- G01 - MEASURING TESTING
Information Patent Grant
Method of establishing a lot grade system for product lots in a sem...
- Patent number 7,908,023
- Issue date Mar 15, 2011
- International Business Machines Corporation
- Edward J. Crawford
- G05 - CONTROLLING REGULATING
Information Patent Grant
Real time system for monitoring the commonality, sensitivity, and r...
- Patent number 7,856,332
- Issue date Dec 21, 2010
- International Business Machines Corporation
- Muthukumarasamy Karthikeyan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING
- Publication number 20160216321
- Publication date Jul 28, 2016
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING
- Publication number 20150145544
- Publication date May 28, 2015
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE INTERPOSER
- Publication number 20140145351
- Publication date May 29, 2014
- International Business Machines Corporation
- Oleg Gluschenkov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LCR TEST CIRCUIT STRUCTURE FOR DETECTING METAL GATE DEFECT CONDITIONS
- Publication number 20130169308
- Publication date Jul 4, 2013
- International Business Machines Corporation
- Xu Ouyang
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING
- Publication number 20130106455
- Publication date May 2, 2013
- International Business Machines Corporation
- Robert D. Edwards
- G01 - MEASURING TESTING
Information Patent Application
NONCONTACT ELECTRICAL TESTING WITH OPTICAL TECHNIQUES
- Publication number 20130027051
- Publication date Jan 31, 2013
- International Business Machines Corporation
- Xu Ouyang
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE INTERPOSER
- Publication number 20120241977
- Publication date Sep 27, 2012
- International Business Machines Corporation
- Oleg Gluschenkov
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
WAFER ALIGNMENT SYSTEM WITH OPTICAL COHERENCE TOMOGRAPHY
- Publication number 20120232686
- Publication date Sep 13, 2012
- International Business Machines Corporation
- Yongchun Xin
- G01 - MEASURING TESTING
Information Patent Application
YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING...
- Publication number 20120146682
- Publication date Jun 14, 2012
- International Business Machines Corporation
- Oleg Gluschenkov
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE INTERPOSER
- Publication number 20110115082
- Publication date May 19, 2011
- International Business Machines Corporation
- Oleg Gluschenkov
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING...
- Publication number 20110080189
- Publication date Apr 7, 2011
- International Business Machines Corporation
- Oleg Gluschenkov
- G01 - MEASURING TESTING
Information Patent Application
IN-LINE CHARACTERIZATION
- Publication number 20110068813
- Publication date Mar 24, 2011
- International Business Machines Corporation
- Tso-Hui Ting
- G01 - MEASURING TESTING
Information Patent Application
SECURITY CONTROL OF ANALYSIS RESULTS
- Publication number 20100185675
- Publication date Jul 22, 2010
- International Business Machines Corporation
- Yunsheng Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ESTABLISHING A LOT GRADE SYSTEM FOR PRODUCT LOTS IN A SEM...
- Publication number 20090182447
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Edward J. Crawford
- G05 - CONTROLLING REGULATING
Information Patent Application
REAL TIME SYSTEM FOR MONITORING THE COMMONALITY, SENSITIVITY, AND R...
- Publication number 20090143999
- Publication date Jun 4, 2009
- International Business Machines Corporation
- Muthukumarasamy Karthikeyan
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED YIELD SPLIT LOT (EWR) AND PROCESS CHANGE NOTIFICATION (PC...
- Publication number 20090125829
- Publication date May 14, 2009
- International Business Machines Corporation
- ANDREW S. DALTON
- G05 - CONTROLLING REGULATING

Tso-Hui Ting

Person

Patents Grantslast 30 patents

LCR test circuit structure for detecting metal gate defect conditions

Semiconductor wafer probing system including pressure sensing and c...

Configurable interposer

Pressure sensing and control for semiconductor wafer probing

Yield enhancement for stacked chips through rotationally-connecting...

Pressure sensing and control for semiconductor wafer probing

Configurable interposer

Noncontact electrical testing with optical techniques

Wafer alignment system with optical coherence tomography

Security control of analysis results

In-line characterization of a device under test

Configurable interposer

Yield enhancement for stacked chips through rotationally-connecting...

Method of establishing a lot grade system for product lots in a sem...

Real time system for monitoring the commonality, sensitivity, and r...

Patents Applicationslast 30 patents

PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING

PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING

CONFIGURABLE INTERPOSER

LCR TEST CIRCUIT STRUCTURE FOR DETECTING METAL GATE DEFECT CONDITIONS

PRESSURE SENSING AND CONTROL FOR SEMICONDUCTOR WAFER PROBING

NONCONTACT ELECTRICAL TESTING WITH OPTICAL TECHNIQUES

CONFIGURABLE INTERPOSER

WAFER ALIGNMENT SYSTEM WITH OPTICAL COHERENCE TOMOGRAPHY

YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING...

CONFIGURABLE INTERPOSER

YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING...

IN-LINE CHARACTERIZATION

SECURITY CONTROL OF ANALYSIS RESULTS

METHOD OF ESTABLISHING A LOT GRADE SYSTEM FOR PRODUCT LOTS IN A SEM...

REAL TIME SYSTEM FOR MONITORING THE COMMONALITY, SENSITIVITY, AND R...

AUTOMATED YIELD SPLIT LOT (EWR) AND PROCESS CHANGE NOTIFICATION (PC...