Tsuguhiko SATO

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analysis device and specimen inspection automation system
- Patent number 10,768,187
- Issue date Sep 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Kenichi Yasuzawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND SPECIMEN INSPECTION AUTOMATION SYSTEM
- Publication number 20180203027
- Publication date Jul 19, 2018
- Hitachi High-Technologies Corporation
- Kenichi YASUZAWA
- G01 - MEASURING TESTING