TREA

Tsuguhiko SATOU

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis device
    • Patent number 10,234,472
    • Issue date Mar 19, 2019
    • Hitachi High-Technologies Corporation
    • Hirofumi Sasaki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYSER
    • Publication number 20180217173
    • Publication date Aug 2, 2018
    • Hitachi High-Technologies Corporation
    • Satoshi SHIBUYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20170212137
    • Publication date Jul 27, 2017
    • Hitachi High-Technologies Corporation
    • Hirofumi SASAKI
    • G01 - MEASURING TESTING