Tsugumi Matsuishi

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit
- Patent number 6,601,177
- Issue date Jul 29, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Masaki Fujigaya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microcomputer, program development apparatus, and program developme...
- Patent number 5,463,738
- Issue date Oct 31, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Tsugumi Matsuishi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method of manufacturing and testing semiconductor device using asse...
- Publication number 20050146337
- Publication date Jul 7, 2005
- Renesas Technology Corp.
- Mitsunori Matsunaga
- G01 - MEASURING TESTING
Information Patent Application
Burn-in test adapter and burn-in test apparatus
- Publication number 20050098778
- Publication date May 12, 2005
- Renesas Technology Corp.
- Mitsunori Matsunaga
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit having a scan test
- Publication number 20040135177
- Publication date Jul 15, 2004
- Renesas Technology Corp.
- Tsugumi Matsuishi
- G01 - MEASURING TESTING