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Tsukasa Kojima
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Sapporo-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Control method of surface texture measuring apparatus
Patent number
10,612,917
Issue date
Apr 7, 2020
Mitutoyo Corporation
Tetsuya Koga
G01 - MEASURING TESTING
Information
Patent Grant
Part program generating device of surface texture measuring apparatus
Patent number
10,521,923
Issue date
Dec 31, 2019
Mitutoyo Corporation
Tetsuya Koga
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method of measuring a circular shape characteristic and circular sh...
Patent number
9,151,588
Issue date
Oct 6, 2015
Mitutoyo Corporation
Junji Sakurada
G01 - MEASURING TESTING
Information
Patent Grant
Image measuring apparatus, program, and teaching method of image me...
Patent number
8,538,165
Issue date
Sep 17, 2013
Mitutoyo Corporation
Tsukasa Kojima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surface texture measuring device, surface texture measuring method,...
Patent number
8,364,441
Issue date
Jan 29, 2013
Mitutoyo Corporation
Tsukasa Kojima
G01 - MEASURING TESTING
Information
Patent Grant
Surface texture measuring device, surface texture measuring method...
Patent number
8,196,457
Issue date
Jun 12, 2012
Mitutoyo Corporation
Hiroyuki Hidaka
G01 - MEASURING TESTING
Information
Patent Grant
Roundness measuring device, method and program for measuring roundness
Patent number
7,636,646
Issue date
Dec 22, 2009
Mitutoyo Corporation
Tsukasa Kojima
G01 - MEASURING TESTING
Information
Patent Grant
Form measuring instrument, form measuring method and form measuring...
Patent number
7,542,872
Issue date
Jun 2, 2009
Mitutoyo Corporation
Soichi Kadowaki
G01 - MEASURING TESTING
Information
Patent Grant
Width-measuring method and surface texture measuring instrument
Patent number
7,036,238
Issue date
May 2, 2006
Mitutoyo Corporation
Tsukasa Kojima
G01 - MEASURING TESTING
Information
Patent Grant
Workpiece coordinate system origin setting method, workpiece coordi...
Patent number
6,895,359
Issue date
May 17, 2005
Mitutoyo Corporation
Junji Sakurada
G01 - MEASURING TESTING
Information
Patent Grant
Traverse linearity compensation method and rotational accuracy comp...
Patent number
6,546,640
Issue date
Apr 15, 2003
Mitutoyo Corporation
Eiji Okada
G01 - MEASURING TESTING
Information
Patent Grant
Roundness measuring apparatus
Patent number
5,694,339
Issue date
Dec 2, 1997
Mitutoyo Corporation
Takao Ishitoya
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
PART PROGRAM GENERATING DEVICE OF SURFACE TEXTURE MEASURING APPARATUS
Publication number
20170270684
Publication date
Sep 21, 2017
MITUTOYO CORPORATION
Tetsuya KOGA
G01 - MEASURING TESTING
Information
Patent Application
CONTROL METHOD OF SURFACE TEXTURE MEASURING APPARATUS
Publication number
20170270685
Publication date
Sep 21, 2017
MITUTOYO CORPORATION
Tetsuya KOGA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MEASURING A CIRCULAR SHAPE CHARACTERISTIC AND CIRCULAR SH...
Publication number
20130006579
Publication date
Jan 3, 2013
MITUTOYO CORPORATION
Junji SAKURADA
G01 - MEASURING TESTING
Information
Patent Application
IMAGE MEASURING APPARATUS, PROGRAM, AND TEACHING METHOD OF IMAGE ME...
Publication number
20110280496
Publication date
Nov 17, 2011
MITUTOYO CORPORATION
Tsukasa KOJIMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Surface texture measuring device, surface texture measuring method,...
Publication number
20100286961
Publication date
Nov 11, 2010
Mitutoyo Corporation
Tsukasa Kojima
G01 - MEASURING TESTING
Information
Patent Application
Surface texture measuring device, surface texture measuring method...
Publication number
20090049893
Publication date
Feb 26, 2009
Mitutoyo Corporation
Hiroyuki Hidaka
G01 - MEASURING TESTING
Information
Patent Application
Roundness measuring device, method and program for measuring roundness
Publication number
20090048799
Publication date
Feb 19, 2009
Mitutoyo Corporation
Soichi Kadowaki
G01 - MEASURING TESTING
Information
Patent Application
Roundness measuring device, method and program for measuring roundness
Publication number
20080294369
Publication date
Nov 27, 2008
MITUTOYO CORPORATION
Tsukasa Kojima
G01 - MEASURING TESTING
Information
Patent Application
Form measuring instrument, form measuring method and form measuring...
Publication number
20070198212
Publication date
Aug 23, 2007
Mitutoyo Corporation
Soichi Kadowaki
G01 - MEASURING TESTING
Information
Patent Application
Width-measuring method and surface texture measuring instrument
Publication number
20050132591
Publication date
Jun 23, 2005
Mitutoyo Corporation
Tsukasa Kojima
G01 - MEASURING TESTING
Information
Patent Application
Workpiece coordinate system origin setting method, workpiece coordi...
Publication number
20040107073
Publication date
Jun 3, 2004
Mitutoyo Corporation
Junji Sakurada
G01 - MEASURING TESTING
Information
Patent Application
Traverse linearity compensation method and rotational accuracy comp...
Publication number
20010008047
Publication date
Jul 19, 2001
Mitutoyo Corporation
Eiji Okada
G01 - MEASURING TESTING