Tsukasa Nakai

Person

Hino-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor measurement device and method of measuring semiconductor
- Patent number 11,060,990
- Issue date Jul 13, 2021
- TOSHIBA MEMORY CORPORATION
- Jun Hirota
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method of scanning probe microscopy using penetrative pre...
- Patent number 10,545,170
- Issue date Jan 28, 2020
- TOSHIBA MEMORY CORPORATION
- Jun Hirota
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measurement method using the same
- Patent number 10,345,336
- Issue date Jul 9, 2019
- TOSHIBA MEMORY CORPORATION
- Jun Hirota
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 9,570,514
- Issue date Feb 14, 2017
- Kabushiki Kaisha Toshiba
- Hikari Tajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile memory device
- Patent number 9,536,894
- Issue date Jan 3, 2017
- Kabushiki Kaisha Toshiba
- Hikari Tajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile memory device and method for reading out data
- Patent number 9,536,616
- Issue date Jan 3, 2017
- Kabushiki Kaisha Toshiba
- Hikari Tajima
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 9,450,026
- Issue date Sep 20, 2016
- Kabushiki Kaisha Toshiba
- Hikari Tajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device
- Patent number 9,379,164
- Issue date Jun 28, 2016
- Kabushiki Kaisha Toshiba
- Tsukasa Nakai
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit device
- Patent number 9,287,499
- Issue date Mar 15, 2016
- Kabushiki Kaisha Toshiba
- Hikari Tajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Superlattice phase change memory device
- Patent number 9,142,771
- Issue date Sep 22, 2015
- Kabushiki Kaisha Toshiba
- Aoi Hidaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device
- Patent number 9,136,468
- Issue date Sep 15, 2015
- Kabushiki Kaisha Toshiba
- Tsukasa Nakai
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and method for manufacturing the same
- Patent number 9,076,685
- Issue date Jul 7, 2015
- Kabushiki Kaisha Toshiba
- Nobuhito Kuge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device
- Patent number 9,030,881
- Issue date May 12, 2015
- Kabushiki Kaisha Toshiba
- Hiroki Tokuhira
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile semiconductor memory device and operating method of the...
- Patent number 9,019,777
- Issue date Apr 28, 2015
- Kabushiki Kaisha Toshiba
- Tsukasa Nakai
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 9,018,682
- Issue date Apr 28, 2015
- Kabushiki Kaisha Toshiba
- Takashi Izumida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive element and writing method of magnetic memory
- Patent number 8,964,459
- Issue date Feb 24, 2015
- Kabushiki Kaisha Toshiba
- Tsukasa Nakai
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile semiconductor memory device
- Patent number 8,809,931
- Issue date Aug 19, 2014
- Kabushiki Kaisha Toshiba
- Tsukasa Nakai
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile semiconductor memory device
- Patent number 8,735,859
- Issue date May 27, 2014
- Kabushiki Kaisha Toshiba
- Shuichi Kuboi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information recording/reproducing device
- Patent number 8,581,424
- Issue date Nov 12, 2013
- Kabushiki Kaisha Toshiba
- Takahiro Hirai
- G11 - INFORMATION STORAGE
Information Patent Grant
Information recording and reproducing device
- Patent number 8,487,345
- Issue date Jul 16, 2013
- Kabushiki Kaisha Toshiba
- Takayuki Tsukamoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Information recording and reproducing device for high-recording den...
- Patent number 8,431,920
- Issue date Apr 30, 2013
- Kabushiki Kaisha Toshiba
- Chikayoshi Kamata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Information recording and reproducing device
- Patent number 8,416,606
- Issue date Apr 9, 2013
- Kabushiki Kaisha Toshiba
- Takayuki Tsukamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile semiconductor memory having buffer layer containing nit...
- Patent number 8,395,138
- Issue date Mar 12, 2013
- Kabushiki Kaisha Toshiba
- Kazuhiko Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device
- Patent number 8,378,331
- Issue date Feb 19, 2013
- Kabushiki Kaisha Toshiba
- Yasuhiro Satoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-volatile semiconductor memory device including a variable resis...
- Patent number 8,339,834
- Issue date Dec 25, 2012
- Kabushiki Kaisha Toshiba
- Tsukasa Nakai
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile semiconductor memory device including a variable resist...
- Patent number 8,334,525
- Issue date Dec 18, 2012
- Kabushiki Kaisha Toshiba
- Tsukasa Nakai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information recording/reproducing device
- Patent number 8,305,797
- Issue date Nov 6, 2012
- Kabushiki Kaisha Toshiba
- Shinya Aoki
- G11 - INFORMATION STORAGE
Information Patent Grant
Information recording and reproducing device
- Patent number 8,269,205
- Issue date Sep 18, 2012
- Kabushiki Kaisha Toshiba
- Kohichi Kubo
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nonvolatile memory device and method for manufacturing same
- Patent number 8,264,866
- Issue date Sep 11, 2012
- Kabushiki Kaisha Toshiba
- Hiroyuki Fukumizu
- G11 - INFORMATION STORAGE
Information Patent Grant
Storage medium, reproducing method, and recording method
- Patent number 8,232,042
- Issue date Jul 31, 2012
- Kabushiki Kaisha Toshiba
- Tsukasa Nakai
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE AND METHOD OF MEASURING SEMICONDUCTOR
- Publication number 20190293586
- Publication date Sep 26, 2019
- Toshiba Memory Corporation
- Jun HIROTA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD USING THE SAME
- Publication number 20170269123
- Publication date Sep 21, 2017
- Kabushiki Kaisha Toshiba
- Jun HIROTA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING METHOD OF SCANNING PROBE MICROSCOPY
- Publication number 20160377651
- Publication date Dec 29, 2016
- Kabushiki Kaisha Toshiba
- Jun HIROTA
- G01 - MEASURING TESTING
Information Patent Application
NON-VOLATILE MEMORY DEVICE AND METHOD FOR READING OUT DATA
- Publication number 20160372206
- Publication date Dec 22, 2016
- KABUSHIKI KAISHA TOSHIBA
- Hikari Tajima
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE
- Publication number 20160064452
- Publication date Mar 3, 2016
- Kabushiki Kaisha Toshiba
- Yoshihiro UEDA
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY DEVICE
- Publication number 20160035741
- Publication date Feb 4, 2016
- Kabushiki Kaisha Toshiba
- Hikari TAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20150357379
- Publication date Dec 10, 2015
- KABUSHIKI KAISHA TOSHIBA
- Hikari TAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE
- Publication number 20150349252
- Publication date Dec 3, 2015
- KABUSHIKI KAISHA TOSHIBA
- Hikari TAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE
- Publication number 20150340605
- Publication date Nov 26, 2015
- KABUSHIKI KAISHA TOSHIBA
- Hikari TAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20150270312
- Publication date Sep 24, 2015
- KABUSHIKI KAISHA TOSHIBA
- Hikari TAJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE
- Publication number 20150255514
- Publication date Sep 10, 2015
- Kabushiki Kaisha Toshiba
- Tsukasa NAKAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE
- Publication number 20150255515
- Publication date Sep 10, 2015
- Kabushiki Kaisha Toshiba
- Tsukasa NAKAI
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE
- Publication number 20150008385
- Publication date Jan 8, 2015
- Kabushiki Kaisha Toshiba
- Aoi HIDAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20140367758
- Publication date Dec 18, 2014
- KABUSHIKI KAISHA TOSHIBA
- Takashi IZUMIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20140346585
- Publication date Nov 27, 2014
- KABUSHIKI KAISHA TOSHIBA
- Nobuhito KUGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
- Publication number 20140254276
- Publication date Sep 11, 2014
- Hiroki TOKUHIRA
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
- Publication number 20140241050
- Publication date Aug 28, 2014
- Tsukasa NAKAI
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD OF THE...
- Publication number 20140063924
- Publication date Mar 6, 2014
- Kabushiki Kaisha Toshiba
- Tsukasa Nakai
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
- Publication number 20130248965
- Publication date Sep 26, 2013
- Tsukasa NAKAI
- G11 - INFORMATION STORAGE
Information Patent Application
MAGNETORESISTIVE ELEMENT AND WRITING METHOD OF MAGNETIC MEMORY
- Publication number 20130250670
- Publication date Sep 26, 2013
- Kabushiki Kaisha Toshiba
- Tsukasa NAKAI
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
- Publication number 20120273743
- Publication date Nov 1, 2012
- Kabushiki Kaisha Toshiba
- Shuichi Kuboi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION RECORDING/REPRODUCING DEVICE
- Publication number 20120061732
- Publication date Mar 15, 2012
- Takahiro HIRAI
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY DEVICE
- Publication number 20110303888
- Publication date Dec 15, 2011
- Kabushiki Kaisha Toshiba
- Hiroyuki FUKUMIZU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION RECORDING AND REPRODUCING DEVICE
- Publication number 20110216582
- Publication date Sep 8, 2011
- Kabushiki Kaisha Toshiba
- Takayuki Tsukamoto
- G11 - INFORMATION STORAGE
Information Patent Application
INFORMATION RECORDING/REPRODUCING DEVICE
- Publication number 20110216576
- Publication date Sep 8, 2011
- Kabushiki Kaisha Toshiba
- Shinya Aoki
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE
- Publication number 20110205781
- Publication date Aug 25, 2011
- Kabushiki Kaisha Toshiba
- Tsukasa Nakai
- G11 - INFORMATION STORAGE
Information Patent Application
INFORMATION RECORDING AND REPRODUCING DEVICE
- Publication number 20110068319
- Publication date Mar 24, 2011
- Kabushiki Kaisha Toshiba
- Takayuki TSUKAMOTO
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20110069525
- Publication date Mar 24, 2011
- Kabushiki Kaisha Toshiba
- Hiroyuki FUKUMIZU
- G11 - INFORMATION STORAGE
Information Patent Application
INFORMATION RECORDING AND REPRODUCING DEVICE
- Publication number 20110062407
- Publication date Mar 17, 2011
- Chikayoshi KAMATA
- G11 - INFORMATION STORAGE
Information Patent Application
INFORMATION RECORDING AND REPRODUCING DEVICE
- Publication number 20110031459
- Publication date Feb 10, 2011
- KABUSHIKI KAISHA TOSHIBA
- Kohichi KUBO
- G11 - INFORMATION STORAGE

Tsukasa Nakai

Person

Patents Grantslast 30 patents

Semiconductor measurement device and method of measuring semiconductor

Measuring method of scanning probe microscopy using penetrative pre...

Scanning probe microscope and measurement method using the same

Semiconductor device

Non-volatile memory device

Non-volatile memory device and method for reading out data

Semiconductor device

Integrated circuit device

Integrated circuit device

Superlattice phase change memory device

Nonvolatile semiconductor memory device

Semiconductor memory device and method for manufacturing the same

Nonvolatile semiconductor memory device

Nonvolatile semiconductor memory device and operating method of the...

Semiconductor memory device

Magnetoresistive element and writing method of magnetic memory

Nonvolatile semiconductor memory device

Nonvolatile semiconductor memory device

Information recording/reproducing device

Information recording and reproducing device

Information recording and reproducing device for high-recording den...

Information recording and reproducing device

Nonvolatile semiconductor memory having buffer layer containing nit...

Nonvolatile semiconductor memory device

Non-volatile semiconductor memory device including a variable resis...

Nonvolatile semiconductor memory device including a variable resist...

Information recording/reproducing device

Information recording and reproducing device

Nonvolatile memory device and method for manufacturing same

Storage medium, reproducing method, and recording method

Patents Applicationslast 30 patents

SEMICONDUCTOR MEASUREMENT DEVICE AND METHOD OF MEASURING SEMICONDUCTOR

SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD USING THE SAME

MEASURING METHOD OF SCANNING PROBE MICROSCOPY

NON-VOLATILE MEMORY DEVICE AND METHOD FOR READING OUT DATA

MEMORY DEVICE

NON-VOLATILE MEMORY DEVICE

SEMICONDUCTOR DEVICE

INTEGRATED CIRCUIT DEVICE

INTEGRATED CIRCUIT DEVICE

SEMICONDUCTOR DEVICE

INTEGRATED CIRCUIT DEVICE

INTEGRATED CIRCUIT DEVICE

MEMORY DEVICE

SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD OF THE...

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

MAGNETORESISTIVE ELEMENT AND WRITING METHOD OF MAGNETIC MEMORY

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

INFORMATION RECORDING/REPRODUCING DEVICE

NONVOLATILE MEMORY DEVICE

INFORMATION RECORDING AND REPRODUCING DEVICE

INFORMATION RECORDING/REPRODUCING DEVICE

NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE

INFORMATION RECORDING AND REPRODUCING DEVICE

NONVOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME

INFORMATION RECORDING AND REPRODUCING DEVICE

INFORMATION RECORDING AND REPRODUCING DEVICE