Tsukasa Shishika

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Substance analyzer and substance analysis method
- Patent number 11,776,800
- Issue date Oct 3, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and mass spectrometry
- Patent number 9,105,453
- Issue date Aug 11, 2015
- Hitachi High-Technologies Corporation
- Tsukasa Shishika
- G08 - SIGNALLING
Information Patent Grant
Signal processing device, mass spectrometer, and photometer
- Patent number 8,633,841
- Issue date Jan 21, 2014
- Hitachi High-Technologies Corporation
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectroscope and mass spectrometry
- Patent number 8,274,044
- Issue date Sep 25, 2012
- Hitachi High-Technologies Corporation
- Shinji Yoshioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer, method of mass spectrometry and program for mass...
- Patent number 8,030,611
- Issue date Oct 4, 2011
- Hitachi High-Technologies Corporation
- Yoshinori Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 7,999,222
- Issue date Aug 16, 2011
- Hitachi High-Technologies Corporation
- Tsukasa Shishika
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for mass spectrometry
- Patent number 7,928,365
- Issue date Apr 19, 2011
- Hitachi High-Technologies Corporation
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Data acquisition system
- Patent number 7,890,074
- Issue date Feb 15, 2011
- Hitachi High-Technologies Corporation
- Kenichi Shinbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap time-of-flight mass spectrometer
- Patent number 7,755,035
- Issue date Jul 13, 2010
- Hitachi High-Technologies Corporation
- Hiroshi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and its apparatus for mass spectrometry
- Patent number 7,476,850
- Issue date Jan 13, 2009
- Hitachi High-Technologies Corporation
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...
- Patent number 7,186,973
- Issue date Mar 6, 2007
- Hitachi High-Technologies Corporation
- Yasushi Terui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 7,064,319
- Issue date Jun 20, 2006
- Hitachi High-Technologies Corporation
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE-ANALYZING APPARATUS
- Publication number 20220412848
- Publication date Dec 29, 2022
- Hitachi High-Tech Corporation
- Akimasa Osaka
- G01 - MEASURING TESTING
Information Patent Application
SUBSTANCE ANALYZER AND SUBSTANCE ANALYSIS METHOD
- Publication number 20220359182
- Publication date Nov 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasuaki TAKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLUMN AND EXCHANGE DEVICE
- Publication number 20190317061
- Publication date Oct 17, 2019
- Hitachi High-Technologies Corporation
- Hiroaki NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY
- Publication number 20150108341
- Publication date Apr 23, 2015
- Hitachi High-Technologies Corporation
- Tsukasa Shishika
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL PROCESSING DEVICE, MASS SPECTROMETER, AND PHOTOMETER
- Publication number 20120154190
- Publication date Jun 21, 2012
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR MASS SPECTROMETRY
- Publication number 20110192970
- Publication date Aug 11, 2011
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROSCOPE AND MASS SPECTROMETRY
- Publication number 20110121174
- Publication date May 26, 2011
- Shinji Yoshioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Time-Of-Flight Mass Spectrometer
- Publication number 20090294659
- Publication date Dec 3, 2009
- Tsukasa SHISHIKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer, method of mass spectrometry and program for mass...
- Publication number 20090236516
- Publication date Sep 24, 2009
- Hitachi High-Technologies Corporation
- Yoshinori Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap time-of-flight mass spectrometer
- Publication number 20080245962
- Publication date Oct 9, 2008
- Hitachi High-Technologies Corporation
- Hiroshi Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA ACQUISITION SYSTEM
- Publication number 20080073504
- Publication date Mar 27, 2008
- Kenichi Shinbo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and its apparatus for mass spectrometry
- Publication number 20060289739
- Publication date Dec 28, 2006
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for mass spectrometry
- Publication number 20060248942
- Publication date Nov 9, 2006
- Fujio Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...
- Publication number 20050279926
- Publication date Dec 22, 2005
- Yasushi Terui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometer
- Publication number 20040195502
- Publication date Oct 7, 2004
- Yuichiro Hashimoto
- H01 - BASIC ELECTRIC ELEMENTS

Tsukasa Shishika

Person

Patents Grantslast 30 patents

Substance analyzer and substance analysis method

Mass spectrometer and mass spectrometry

Signal processing device, mass spectrometer, and photometer

Mass spectroscope and mass spectrometry

Mass spectrometer, method of mass spectrometry and program for mass...

Time-of-flight mass spectrometer

Method and apparatus for mass spectrometry

Data acquisition system

Ion trap time-of-flight mass spectrometer

Method and its apparatus for mass spectrometry

Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...

Mass spectrometer

Patents Applicationslast 30 patents

SAMPLE-ANALYZING APPARATUS

SUBSTANCE ANALYZER AND SUBSTANCE ANALYSIS METHOD

COLUMN AND EXCHANGE DEVICE

MASS SPECTROMETER AND MASS SPECTROMETRY

SIGNAL PROCESSING DEVICE, MASS SPECTROMETER, AND PHOTOMETER

METHOD AND APPARATUS FOR MASS SPECTROMETRY

MASS SPECTROSCOPE AND MASS SPECTROMETRY

Time-Of-Flight Mass Spectrometer

Mass spectrometer, method of mass spectrometry and program for mass...

Ion trap time-of-flight mass spectrometer

DATA ACQUISITION SYSTEM

Method and its apparatus for mass spectrometry

Method and apparatus for mass spectrometry

Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...

Mass spectrometer