Tsunehiro Sakai

Person

Mito, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample observation device having a selectable acceleration voltage
- Patent number 10,141,159
- Issue date Nov 27, 2018
- Hitachi High-Technologies Corporation
- Ayumi Doi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect image processing apparatus, defect image processing method,...
- Patent number 8,995,748
- Issue date Mar 31, 2015
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Image classification standard update method, program, and image cla...
- Patent number 8,625,906
- Issue date Jan 7, 2014
- Hitachi High-Technologies Corporation
- Yuya Isomae
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor defect classifying method, semiconductor defect class...
- Patent number 8,595,666
- Issue date Nov 26, 2013
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G01 - MEASURING TESTING
Information Patent Grant
Observation condition determination support device and observation...
- Patent number 8,472,696
- Issue date Jun 25, 2013
- Hitachi High-Technologies Corporation
- Junko Konishi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Sample Observation Device
- Publication number 20150371816
- Publication date Dec 24, 2015
- Hitachi High-Technologies Corporation
- Ayumi DOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECIPE GENERATION APPARATUS, INSPECTION SUPPORT APPARATUS, INSPECTI...
- Publication number 20140177940
- Publication date Jun 26, 2014
- Hitachi High-Technologies Corporation
- Ryo Nakagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN REVIEW TOOL, RECIPE MAKING TOOL, AND METHOD OF MAKING RECIPE
- Publication number 20130283227
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT IMAGE PROCESSING APPARATUS, DEFECT IMAGE PROCESSING METHOD,...
- Publication number 20120141011
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Tsunehiro Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEFECT CLASSIFYING METHOD, SEMICONDUCTOR DEFECT CLASS...
- Publication number 20120131529
- Publication date May 24, 2012
- Hitachi High-Technologies Corporation
- Koichi Hayakawa
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION CONDITION DETERMINATION SUPPORT DEVICE AND OBSERVATION...
- Publication number 20110311125
- Publication date Dec 22, 2011
- Junko Konishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE CLASSIFICATION STANDARD UPDATE METHOD, PROGRAM, AND IMAGE CLA...
- Publication number 20110274362
- Publication date Nov 10, 2011
- Hitachi High-Techologies Corporation
- Yuya Isomae
- G06 - COMPUTING CALCULATING COUNTING

Tsunehiro Sakai

Person

Patents Grantslast 30 patents

Sample observation device having a selectable acceleration voltage

Defect image processing apparatus, defect image processing method,...

Image classification standard update method, program, and image cla...

Semiconductor defect classifying method, semiconductor defect class...

Observation condition determination support device and observation...

Patents Applicationslast 30 patents

Sample Observation Device

RECIPE GENERATION APPARATUS, INSPECTION SUPPORT APPARATUS, INSPECTI...

PATTERN REVIEW TOOL, RECIPE MAKING TOOL, AND METHOD OF MAKING RECIPE

DEFECT IMAGE PROCESSING APPARATUS, DEFECT IMAGE PROCESSING METHOD,...

SEMICONDUCTOR DEFECT CLASSIFYING METHOD, SEMICONDUCTOR DEFECT CLASS...

OBSERVATION CONDITION DETERMINATION SUPPORT DEVICE AND OBSERVATION...

IMAGE CLASSIFICATION STANDARD UPDATE METHOD, PROGRAM, AND IMAGE CLA...