Tsuneo Abe

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Testing probe system for testing semiconductor die, multi-channel d...
- Patent number 11,555,828
- Issue date Jan 17, 2023
- Micron Technology, Inc.
- Vikrant Upadhyaya
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device including a clock adjustment circuit
- Patent number 11,120,855
- Issue date Sep 14, 2021
- Micron Technology, Inc.
- Tsuneo Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including a clock adjustment circuit
- Patent number 10,388,341
- Issue date Aug 20, 2019
- Micron Technology, Inc.
- Tsuneo Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including a clock adjustment circuit
- Patent number 10,181,343
- Issue date Jan 15, 2019
- Micron Technology, Inc.
- Tsuneo Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including a clock adjustment circuit
- Patent number 9,875,778
- Issue date Jan 23, 2018
- Micron Technology, Inc.
- Tsuneo Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 8,565,032
- Issue date Oct 22, 2013
- Elpida Memory, Inc.
- Tsuneo Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
DLL circuit and control method therefor
- Patent number 7,932,759
- Issue date Apr 26, 2011
- Elpida Memory, Inc.
- Tsuneo Abe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
DLL circuit and control method therefor
- Patent number 7,830,189
- Issue date Nov 9, 2010
- Elpida Memory, Inc.
- Tsuneo Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having output impedance adjustment circ...
- Patent number 7,796,447
- Issue date Sep 14, 2010
- Elpida Memory Inc.
- Tsuneo Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device including DLL circuit, and data processing system
- Patent number 7,755,401
- Issue date Jul 13, 2010
- Elpida Memory, Inc.
- Tsuneo Abe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor integrated circuit device and method of testing the same
- Patent number 7,644,325
- Issue date Jan 5, 2010
- Elpida Memory, Inc.
- Tsuneo Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
Duty ratio adjustment
- Patent number 7,449,931
- Issue date Nov 11, 2008
- Elpida Memory, Inc.
- Tsuneo Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having a test circuit for testing an output ci...
- Patent number 7,050,920
- Issue date May 23, 2006
- Elpida Memory, Inc.
- Tsuneo Abe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having a test circuit for testing an output ci...
- Patent number 6,999,889
- Issue date Feb 14, 2006
- Elpida Memory, Inc.
- Tsuneo Abe
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, testing device thereof and testing method the...
- Patent number 6,356,490
- Issue date Mar 12, 2002
- NEC Corporation
- Shoichi Matsuo
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TESTING PROBE SYSTEM FOR TESTING SEMICONDUCTOR DIE, MULTI-CHANNEL D...
- Publication number 20220011344
- Publication date Jan 13, 2022
- Micron Technology, Inc.
- Vikrant Upadhyaya
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A CLOCK ADJUSTMENT CIRCUIT
- Publication number 20190333557
- Publication date Oct 31, 2019
- Micron Technology, Inc.
- TSUNEO ABE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A CLOCK ADJUSTMENT CIRCUIT
- Publication number 20180366169
- Publication date Dec 20, 2018
- Micron Technology, Inc.
- TSUNEO ABE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A CLOCK ADJUSTMENT CIRCUIT
- Publication number 20180102153
- Publication date Apr 12, 2018
- Micron Technology, Inc.
- TSUNEO ABE
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE INCLUDING A CLOCK ADJUSTMENT CIRCUIT
- Publication number 20150146495
- Publication date May 28, 2015
- Micron Technology, Inc.
- TSUNEO ABE
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device
- Publication number 20110249521
- Publication date Oct 13, 2011
- Elpida Memory, Inc.
- Tsuneo Abe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR CIRCUIT
- Publication number 20110248756
- Publication date Oct 13, 2011
- Elpida Memory, Inc.
- Tsuneo Abe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CLOCK CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME
- Publication number 20110204942
- Publication date Aug 25, 2011
- Elpida Memory, Inc.
- Tsuneo Abe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
EQUIPOTENTIAL PAD CONNECTION
- Publication number 20100320580
- Publication date Dec 23, 2010
- ELPIDA MEMORY, INC.
- Tomoyuki Shibata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DLL CIRCUIT AND CONTROL METHOD THEREFOR
- Publication number 20100060334
- Publication date Mar 11, 2010
- Elpida Memory, Inc.
- Tsuneo Abe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DLL CIRCUIT AND CONTROL METHOD THEREFOR
- Publication number 20100052751
- Publication date Mar 4, 2010
- Elpida Memory, Inc.
- Tsuneo Abe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor device including DLL circuit, and data processing system
- Publication number 20090102527
- Publication date Apr 23, 2009
- Elpida Memory, Inc.
- Tsuneo Abe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE HAVING OUTPUT IMPEDANCE ADJUSTMENT CIRC...
- Publication number 20080259697
- Publication date Oct 23, 2008
- Elpida Memory, Inc.
- Tsuneo Abe
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device and method of testing the same
- Publication number 20070245186
- Publication date Oct 18, 2007
- Elpida Memory, Inc.
- Tsuneo Abe
- G01 - MEASURING TESTING
Information Patent Application
DUTY RATIO ADJUSTMENT
- Publication number 20070103219
- Publication date May 10, 2007
- Tsuneo Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING A TEST CIRCUIT FOR TESTING AN OUTPUT CI...
- Publication number 20060064272
- Publication date Mar 23, 2006
- Elpida Memory, Inc.
- Tsuneo Abe
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having a test circuit for testing an output ci...
- Publication number 20040148123
- Publication date Jul 29, 2004
- Elpida Memory, Inc.
- Tsuneo Abe
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Testing probe system for testing semiconductor die, multi-channel d...

Semiconductor device including a clock adjustment circuit

Semiconductor device including a clock adjustment circuit

Semiconductor device including a clock adjustment circuit

Semiconductor device including a clock adjustment circuit

Semiconductor device

DLL circuit and control method therefor

DLL circuit and control method therefor

Semiconductor memory device having output impedance adjustment circ...

Semiconductor device including DLL circuit, and data processing system

Semiconductor integrated circuit device and method of testing the same

Duty ratio adjustment

Semiconductor device having a test circuit for testing an output ci...

Semiconductor device having a test circuit for testing an output ci...

Semiconductor device, testing device thereof and testing method the...

Patents Applicationslast 30 patents

TESTING PROBE SYSTEM FOR TESTING SEMICONDUCTOR DIE, MULTI-CHANNEL D...

SEMICONDUCTOR DEVICE INCLUDING A CLOCK ADJUSTMENT CIRCUIT

SEMICONDUCTOR DEVICE INCLUDING A CLOCK ADJUSTMENT CIRCUIT

SEMICONDUCTOR DEVICE INCLUDING A CLOCK ADJUSTMENT CIRCUIT

SEMICONDUCTOR DEVICE INCLUDING A CLOCK ADJUSTMENT CIRCUIT

Semiconductor device

SEMICONDUCTOR CIRCUIT

CLOCK CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME

EQUIPOTENTIAL PAD CONNECTION

DLL CIRCUIT AND CONTROL METHOD THEREFOR

DLL CIRCUIT AND CONTROL METHOD THEREFOR

Semiconductor device including DLL circuit, and data processing system

SEMICONDUCTOR MEMORY DEVICE HAVING OUTPUT IMPEDANCE ADJUSTMENT CIRC...

Semiconductor integrated circuit device and method of testing the same

DUTY RATIO ADJUSTMENT

SEMICONDUCTOR DEVICE HAVING A TEST CIRCUIT FOR TESTING AN OUTPUT CI...

Semiconductor device having a test circuit for testing an output ci...