Tsuneo Sato

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Chiba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analyzer and X-ray analysis method
- Patent number 8,891,729
- Issue date Nov 18, 2014
- SII NanoTechnology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYZER AND X-RAY ANALYSIS METHOD
- Publication number 20130034204
- Publication date Feb 7, 2013
- Yoshiki MATOBA
- G01 - MEASURING TESTING