Tsuneyuki Ozaki

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Brossard, CA

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for terahertz detection of charged molecules a...
- Patent number 11,614,401
- Issue date Mar 28, 2023
- Institut National de la Recherche Scientifique
- Tsuneyuki Ozaki
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for generating intense, ultrashort pulses of XUV...
- Patent number 11,573,478
- Issue date Feb 7, 2023
- Institut National de la Recherche Scientifique
- Mangaljit Singh
- G02 - OPTICS
Information Patent Grant
Method and system for terahertz radiation detection and characteriz...
- Patent number 11,274,969
- Issue date Mar 15, 2022
- INSTITUT NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Tsuneyuki Ozaki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for characterization of terahertz radiation
- Patent number 10,175,111
- Issue date Jan 8, 2019
- Institut National de la Recherche Scientifique
- Tsuneyuki Ozaki
- G01 - MEASURING TESTING
Information Patent Grant
Spectral-domain interferometric method and system for characterizin...
- Patent number 9,335,213
- Issue date May 10, 2016
- Institut National de la Recherche Scientifique
- Gargi Sharma
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR TERAHERTZ RADIATION DETECTION AND CHARACTERIZ...
- Publication number 20210325250
- Publication date Oct 21, 2021
- Institut National de la Recherche Scientifique
- TSUNEYUKI OZAKI
- G01 - MEASURING TESTING
Information Patent Application
Method and system for generating intense, ultrashort pulses of XUV...
- Publication number 20210173283
- Publication date Jun 10, 2021
- Institut National de la Recherche Scientifique
- MANGALJIT SINGH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR TERAHERTZ DETECTION OF CHARGED MOLECULES A...
- Publication number 20200400560
- Publication date Dec 24, 2020
- Institut National de la Recherche Scientifique
- Tsuneyuki OZAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CHARACTERIZATION OF TERAHERTZ RADIATION
- Publication number 20170336262
- Publication date Nov 23, 2017
- Institut National de la Recherche Scientifique
- TSUNEYUKI OZAKI
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL-DOMAIN INTERFEROMETRIC METHOD AND SYSTEM FOR CHARACTERIZIN...
- Publication number 20150192467
- Publication date Jul 9, 2015
- Institut National de la Recherche Scientifique
- Gargi Sharma
- G01 - MEASURING TESTING