Tsutomu Hayakawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
OH radical measuring device and OH radical measuring method
- Patent number 11,585,761
- Issue date Feb 21, 2023
- IHI Corporation
- Takao Kurata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor memory device and fabrication method thereof
- Patent number 7,919,767
- Issue date Apr 5, 2011
- Elpida Memory, Inc.
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase-change memory device with minimized reduction in thermal effi...
- Patent number 7,755,075
- Issue date Jul 13, 2010
- Elpida Memory, Inc.
- Tsutomu Hayakawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Phase change memory device and method of manufacturing the device
- Patent number 7,728,321
- Issue date Jun 1, 2010
- Elipida Memory Inc.
- Tsutomu Hayakawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and fabrication method thereof
- Patent number 7,723,717
- Issue date May 25, 2010
- Elpida Memory, Inc.
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of producing the same
- Patent number 7,671,360
- Issue date Mar 2, 2010
- Elpida Memory, Inc.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase change memory device and method for manufacturing phase chang...
- Patent number 7,532,507
- Issue date May 12, 2009
- Elpida Memory, Inc.
- Tsutomu Hayakawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Phase-change memory device and method of manufacturing same
- Patent number 7,498,601
- Issue date Mar 3, 2009
- Elpida Memory, Inc.
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase-change memory device and method of manufacturing same
- Patent number 7,368,802
- Issue date May 6, 2008
- Elpida Memory, Inc.
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate electrode and method of fabricating the same
- Patent number 6,861,319
- Issue date Mar 1, 2005
- Elpida Memory, Inc.
- Akira Hoshino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing a semiconductor device having a layered ga...
- Patent number 6,723,608
- Issue date Apr 20, 2004
- Elpida Memory, Inc.
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having wiring detour around step
- Patent number 6,278,151
- Issue date Aug 21, 2001
- NEC Corporation
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor device using half-tone phase sh...
- Patent number 5,902,717
- Issue date May 11, 1999
- NEC Corporation
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method for improved voltage...
- Patent number 5,789,789
- Issue date Aug 4, 1998
- NEC Corporation
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
OH RADICAL MEASURING DEVICE AND OH RADICAL MEASURING METHOD
- Publication number 20210164909
- Publication date Jun 3, 2021
- IHI Corporation
- Takao KURATA
- G01 - MEASURING TESTING
Information Patent Application
Phase-change memory device having heater electrode with improved he...
- Publication number 20080067490
- Publication date Mar 20, 2008
- Elpida Memory, Inc.
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THE SAME
- Publication number 20080061282
- Publication date Mar 13, 2008
- Elpida Memory, Inc.
- Natsuki Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor memory device and fabrication method thereof
- Publication number 20080048170
- Publication date Feb 28, 2008
- Elpida Memory, Inc.
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE-CHANGE MEMORY DEVICE WITH MINIMIZED REDUCTION IN THERMAL EFFI...
- Publication number 20080042118
- Publication date Feb 21, 2008
- Elpida Memory, Inc.
- Tsutomu Hayakawa
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device and fabrication method thereof
- Publication number 20080006813
- Publication date Jan 10, 2008
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CHANGE MEMORY DEVICE AND METHOD FOR MANUFACTURING PHASE CHANG...
- Publication number 20070165452
- Publication date Jul 19, 2007
- Elpida Memory, Inc.
- Tsutomu Hayakawa
- G11 - INFORMATION STORAGE
Information Patent Application
PHASE-CHANGE MEMORY DEVICE AND METHOD OF MANUFACTURING SAME
- Publication number 20070120106
- Publication date May 31, 2007
- ELPIDA MEMORY, INC.
- Tsutomu HAYAKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE-CHANGE MEMORY DEVICE AND METHOD OF MANUFACTURING SAME
- Publication number 20070120107
- Publication date May 31, 2007
- ELPIDA MEMORY, INC.
- Tsutomu HAYAKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase change memory device and method of manufacturing the device
- Publication number 20070069249
- Publication date Mar 29, 2007
- ELPIDA MEMORY INC.
- Tsutomu Hayakawa
- G11 - INFORMATION STORAGE
Information Patent Application
Method for manufacturing a semiconductor device having a layered ga...
- Publication number 20030190798
- Publication date Oct 9, 2003
- ELPIDA MEMORY, INC.
- Tsutomu Hayakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gate electrode and method of fabricating the same
- Publication number 20030146457
- Publication date Aug 7, 2003
- Akira Hoshino
- H01 - BASIC ELECTRIC ELEMENTS

Tsutomu Hayakawa

Person

Patents Grantslast 30 patents

OH radical measuring device and OH radical measuring method

Semiconductor memory device and fabrication method thereof

Phase-change memory device with minimized reduction in thermal effi...

Phase change memory device and method of manufacturing the device

Semiconductor memory device and fabrication method thereof

Semiconductor device and method of producing the same

Phase change memory device and method for manufacturing phase chang...

Phase-change memory device and method of manufacturing same

Phase-change memory device and method of manufacturing same

Gate electrode and method of fabricating the same

Method for manufacturing a semiconductor device having a layered ga...

Semiconductor device having wiring detour around step

Method of fabricating semiconductor device using half-tone phase sh...

Semiconductor device and manufacturing method for improved voltage...

Patents Applicationslast 30 patents

OH RADICAL MEASURING DEVICE AND OH RADICAL MEASURING METHOD

Phase-change memory device having heater electrode with improved he...

SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THE SAME

Semiconductor memory device and fabrication method thereof

PHASE-CHANGE MEMORY DEVICE WITH MINIMIZED REDUCTION IN THERMAL EFFI...

Semiconductor memory device and fabrication method thereof

PHASE CHANGE MEMORY DEVICE AND METHOD FOR MANUFACTURING PHASE CHANG...

PHASE-CHANGE MEMORY DEVICE AND METHOD OF MANUFACTURING SAME

PHASE-CHANGE MEMORY DEVICE AND METHOD OF MANUFACTURING SAME

Phase change memory device and method of manufacturing the device

Method for manufacturing a semiconductor device having a layered ga...

Gate electrode and method of fabricating the same