Tsutomu Kawaguchi

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Nagoya, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charge retention lifetime evaluation method for nonvolatile semicon...
- Patent number 6,339,557
- Issue date Jan 15, 2002
- Denso Corporation
- Tsutomu Kawaguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and fabrication process thereof
- Patent number 6,337,249
- Issue date Jan 8, 2002
- Nippondenso Co., Ltd.
- Hiroyuki Yamane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device having high-concentration region around...
- Patent number 6,236,085
- Issue date May 22, 2001
- Denso Corporation
- Tsutomu Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 5,986,302
- Issue date Nov 16, 1999
- Denso Corporation
- Shigemitsu Fukatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhancement-type semiconductor having reduced leakage current
- Patent number 5,675,167
- Issue date Oct 7, 1997
- Nippondenso Co., Ltd.
- Hiroyuki Yamane
- H01 - BASIC ELECTRIC ELEMENTS