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Tsutomu MIYAMAE
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Yokohama Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device and semiconductor device examination method
Patent number
11,740,287
Issue date
Aug 29, 2023
Kioxia Corporation
Isao Ooigawa
G01 - MEASURING TESTING
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Patent Grant
Semiconductor circuit
Patent number
10,311,965
Issue date
Jun 4, 2019
TOSHIBA MEMORY CORPORATION
Tsutomu Miyamae
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUTOR DEVCE EXAMINATION METHOD
Publication number
20230079823
Publication date
Mar 16, 2023
KIOXIA Corporation
Isao OOIGAWA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR CIRCUIT
Publication number
20180233213
Publication date
Aug 16, 2018
Toshiba Memory Corporation
Tsutomu MIYAMAE
G11 - INFORMATION STORAGE