Tsutomu MIZUGUCHI

Person

Ritto-shi, Shiga, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical characteristic measurement system and calibration method fo...
- Patent number 10,422,695
- Issue date Sep 24, 2019
- Otsuka Electronics Co., Ltd.
- Yoshihiro Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measurement system and calibration method fo...
- Patent number 10,422,694
- Issue date Sep 24, 2019
- Otsuka Electronics Co., Ltd.
- Yoshihiro Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measurement system and calibration method fo...
- Patent number 10,222,261
- Issue date Mar 5, 2019
- Otsuka Electronics Co., Ltd.
- Yoshihiro Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus and optical measurement method
- Patent number 9,921,149
- Issue date Mar 20, 2018
- Otsuka Electronics Co., Ltd.
- Tsutomu Mizuguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectral characteristic measurement apparatus and spectral characte...
- Patent number 9,163,985
- Issue date Oct 20, 2015
- Otsuka Electronics Co., Ltd.
- Hiroyuki Sano
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measurement device and optical characteristi...
- Patent number 8,169,608
- Issue date May 1, 2012
- Otsuka Electronics Co., Ltd.
- Hiroyuki Sano
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measurement device and optical characteristi...
- Patent number 8,169,607
- Issue date May 1, 2012
- Otsuka Electronics Co., Ltd.
- Hiroyuki Sano
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring moving picture response curve
- Patent number 8,164,632
- Issue date Apr 24, 2012
- Otsuka Electronics Co., Ltd.
- Yoshi Enami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Optical characteristic measuring apparatus and measuring method usi...
- Patent number 7,528,967
- Issue date May 5, 2009
- Otsuka Electronics Co., Ltd.
- Makoto Okawauchi
- G01 - MEASURING TESTING
Information Patent Grant
Light scattering measuring probe
- Patent number 6,750,967
- Issue date Jun 15, 2004
- Otsuka Electronics Co., Ltd.
- Kazunori Tsutsui
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM AND CALIBRATION METHOD FO...
- Publication number 20190170578
- Publication date Jun 6, 2019
- Otsuka Electronics Co., Ltd.
- Yoshihiro OSAWA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM AND CALIBRATION METHOD FO...
- Publication number 20190170577
- Publication date Jun 6, 2019
- Otsuka Electronics Co., Ltd.
- Yoshihiro OSAWA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
- Publication number 20170102321
- Publication date Apr 13, 2017
- Otsuka Electronics Co., Ltd.
- Tsutomu MIZUGUCHI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM AND CALIBRATION METHOD FO...
- Publication number 20170010214
- Publication date Jan 12, 2017
- Otsuka Electronics Co., Ltd.
- Yoshihiro OSAWA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL CHARACTERISTIC MEASUREMENT APPARATUS AND SPECTRAL CHARACTE...
- Publication number 20140063497
- Publication date Mar 6, 2014
- Otsuka Electronics Co., Ltd.
- Hiroyuki SANO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTI...
- Publication number 20120075628
- Publication date Mar 29, 2012
- Otsuka Electronics Co., Ltd.
- Hiroyuki SANO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTI...
- Publication number 20100091280
- Publication date Apr 15, 2010
- Otsuka Electronics Co., Ltd.
- Hiroyuki SANO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTIC MEASURING APPARATUS AND MEASURING METHOD USI...
- Publication number 20080285026
- Publication date Nov 20, 2008
- Otsuka Electronics Co., Ltd.
- Makoto OKAWAUCHI
- G01 - MEASURING TESTING
Information Patent Application
Motion picture image processing system and motion picture image pro...
- Publication number 20080238820
- Publication date Oct 2, 2008
- OTSUKA ELECTRONICS CO., LTD.
- Yoshi Enami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for measuring moving picture response curve
- Publication number 20070211146
- Publication date Sep 13, 2007
- OTSUKA ELECTRONICS CO., LTD.
- Yoshi Enami
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Light scattering measuring probe
- Publication number 20030133112
- Publication date Jul 17, 2003
- Kazunori Tsutsui
- G01 - MEASURING TESTING

Tsutomu MIZUGUCHI

Person

Patents Grantslast 30 patents

Optical characteristic measurement system and calibration method fo...

Optical characteristic measurement system and calibration method fo...

Optical characteristic measurement system and calibration method fo...

Optical measurement apparatus and optical measurement method

Spectral characteristic measurement apparatus and spectral characte...

Optical characteristic measurement device and optical characteristi...

Optical characteristic measurement device and optical characteristi...

Method and apparatus for measuring moving picture response curve

Optical characteristic measuring apparatus and measuring method usi...

Light scattering measuring probe

Patents Applicationslast 30 patents

OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM AND CALIBRATION METHOD FO...

OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM AND CALIBRATION METHOD FO...

OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD

OPTICAL CHARACTERISTIC MEASUREMENT SYSTEM AND CALIBRATION METHOD FO...

SPECTRAL CHARACTERISTIC MEASUREMENT APPARATUS AND SPECTRAL CHARACTE...

OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTI...

OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTI...

OPTICAL CHARACTERISTIC MEASURING APPARATUS AND MEASURING METHOD USI...

Motion picture image processing system and motion picture image pro...

Method and apparatus for measuring moving picture response curve

Light scattering measuring probe