Tsutomu Negishi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Specimen machining device and information provision method
- Patent number 11,837,437
- Issue date Dec 5, 2023
- Jeol Ltd.
- Tatsuhito Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum cooling apparatus and ion milling apparatus
- Patent number 11,043,355
- Issue date Jun 22, 2021
- Jeol Ltd.
- Tsutomu Negishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder system and sample observation apparatus
- Patent number 10,930,467
- Issue date Feb 23, 2021
- Jeol Ltd.
- Tsutomu Negishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen holder, specimen preparation device, and positioning method
- Patent number 9,507,139
- Issue date Nov 29, 2016
- Jeol Ltd.
- Tsutomu Negishi
- G02 - OPTICS
Information Patent Grant
Ion beam processing system and sample processing method
- Patent number 8,716,683
- Issue date May 6, 2014
- Jeol Ltd.
- Tsutomu Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Application charging system, information processing apparatus, and...
- Patent number 7,154,616
- Issue date Dec 26, 2006
- Canon Kabushiki Kaisha
- Yoshihiko Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Instrument and method for observing selected stored images acquired...
- Patent number 6,888,137
- Issue date May 3, 2005
- Jeol Ltd.
- Atsushi Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control apparatus for a scanner/printer
- Patent number 6,804,016
- Issue date Oct 12, 2004
- Canon Kabushiki Kaisha
- Yasuhiko Hashimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting holes using charged-particle beam
- Patent number 6,787,770
- Issue date Sep 7, 2004
- Jeol Ltd.
- Naoki Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning charged-particle beam instrument
- Patent number 6,444,991
- Issue date Sep 3, 2002
- Jeol Ltd.
- Atsushi Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Input/output apparatus connected to a plurality of host computers v...
- Patent number 6,321,266
- Issue date Nov 20, 2001
- Canon Kabushiki Kaisha
- Yoshikazu Yokomizo
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Server device and image processing device
- Patent number 6,177,934
- Issue date Jan 23, 2001
- Canon Kabushiki Kaisha
- Susumu Sugiura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Information input/output control apparatus and method for indicatin...
- Patent number 5,996,029
- Issue date Nov 30, 1999
- Canon Kabushiki Kaisha
- Mitsumasa Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing device and information processing method
- Patent number 5,859,956
- Issue date Jan 12, 1999
- Canon Kabushiki Kaisha
- Mitsumasa Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning electron microscope
- Patent number 5,834,774
- Issue date Nov 10, 1998
- Jeol Ltd.
- Tsutomu Negishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information input/output control device and method therefor
- Patent number 5,740,028
- Issue date Apr 14, 1998
- Canon Kabushiki Kaisha
- Mitsumasa Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for automatic focusing of scanning electron mi...
- Patent number 5,130,540
- Issue date Jul 14, 1992
- Jeol Ltd.
- Atsushi Yamada
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Specimen Holder, Specimen Holder Set, and Specimen Preparation Method
- Publication number 20240248014
- Publication date Jul 25, 2024
- JEOL Ltd.
- Tsutomu Negishi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Fabrication of Shield Plate
- Publication number 20240208762
- Publication date Jun 27, 2024
- JEOL Ltd.
- Tsutomu Negishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Milling Apparatus, Shield Plate, and Sample Milling Method
- Publication number 20240096584
- Publication date Mar 21, 2024
- JEOL Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen Machining Device and Specimen Machining Method
- Publication number 20220392739
- Publication date Dec 8, 2022
- JEOL Ltd.
- Munehiro Kozuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen Machining Device and Information Provision Method
- Publication number 20220392744
- Publication date Dec 8, 2022
- JEOL Ltd.
- Tatsuhito Kimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Vacuum Cooling Apparatus and Ion Milling Apparatus
- Publication number 20200185187
- Publication date Jun 11, 2020
- JEOL Ltd.
- Tsutomu Negishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Holder System and Sample Observation Apparatus
- Publication number 20180358201
- Publication date Dec 13, 2018
- JEOL Ltd.
- Tsutomu Negishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen Holder, Specimen Preparation Device, and Positioning Method
- Publication number 20160139398
- Publication date May 19, 2016
- JEOL Ltd.
- Tsutomu Negishi
- G02 - OPTICS
Information Patent Application
Apparatus and Method for Sample Preparation
- Publication number 20150311028
- Publication date Oct 29, 2015
- JEOL Ltd.
- Tsutomu Negishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Beam Processing System and Sample Processing Method
- Publication number 20130134325
- Publication date May 30, 2013
- JEOL Ltd.
- Tsutomu Negishi
- G01 - MEASURING TESTING
Information Patent Application
Method of inspecting holes using charged-particle beam
- Publication number 20030104639
- Publication date Jun 5, 2003
- JEOL Ltd.
- Naoki Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
Application charging system, information processing apparatus, and...
- Publication number 20020051164
- Publication date May 2, 2002
- Yoshihiko Watanabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROL APPARATUS FOR A SCANNER/PRINTER
- Publication number 20020012453
- Publication date Jan 31, 2002
- YASUHIKO HASHIMOTO
- G06 - COMPUTING CALCULATING COUNTING

Tsutomu Negishi

Person

Patents Grantslast 30 patents

Specimen machining device and information provision method

Vacuum cooling apparatus and ion milling apparatus

Sample holder system and sample observation apparatus

Specimen holder, specimen preparation device, and positioning method

Ion beam processing system and sample processing method

Application charging system, information processing apparatus, and...

Instrument and method for observing selected stored images acquired...

Control apparatus for a scanner/printer

Method of inspecting holes using charged-particle beam

Scanning charged-particle beam instrument

Input/output apparatus connected to a plurality of host computers v...

Server device and image processing device

Information input/output control apparatus and method for indicatin...

Information processing device and information processing method

Scanning electron microscope

Information input/output control device and method therefor

Method and apparatus for automatic focusing of scanning electron mi...

Patents Applicationslast 30 patents

Specimen Holder, Specimen Holder Set, and Specimen Preparation Method

Apparatus and Method for Fabrication of Shield Plate

Sample Milling Apparatus, Shield Plate, and Sample Milling Method

Specimen Machining Device and Specimen Machining Method

Specimen Machining Device and Information Provision Method

Vacuum Cooling Apparatus and Ion Milling Apparatus

Sample Holder System and Sample Observation Apparatus

Specimen Holder, Specimen Preparation Device, and Positioning Method

Apparatus and Method for Sample Preparation

Ion Beam Processing System and Sample Processing Method

Method of inspecting holes using charged-particle beam

Application charging system, information processing apparatus, and...

CONTROL APPARATUS FOR A SCANNER/PRINTER