Tsutomu Saito

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus
- Patent number 10,971,347
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Mitsuhiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for adjusting charged particle beam device and adjusting bea...
- Patent number 10,176,968
- Issue date Jan 8, 2019
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device enabling facilitated EBSD detector ana...
- Patent number 9,741,531
- Issue date Aug 22, 2017
- Hitachi High-Technologies Corporation
- Kazuyuki Takeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray processing device and X-ray processing method
- Patent number 9,138,835
- Issue date Sep 22, 2015
- Seiko Precision Inc.
- Ikuo Shiozawa
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Logical CAD navigation for device characteristics evaluation system
- Patent number 8,178,837
- Issue date May 15, 2012
- Hitachi High-Technologies Corporation
- Tohru Ando
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Specimen inspection equipment and how to make the electron beam abs...
- Patent number 8,178,840
- Issue date May 15, 2012
- Hitachi High-Technologies Corporation
- Tomoharu Obuki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing method and semiconductor tester
- Patent number 8,067,752
- Issue date Nov 29, 2011
- Hitachi High-Technologies Corporation
- Tohru Ando
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection apparatus
- Patent number 7,989,766
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe storage container, prober apparatus, probe arranging method a...
- Patent number 7,875,156
- Issue date Jan 25, 2011
- Hitachi High-Technologies Corporation
- Masanori Gunji
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing method and semiconductor tester
- Patent number 7,732,791
- Issue date Jun 8, 2010
- Hitachi High-Technologies Corporation
- Tohru Ando
- G01 - MEASURING TESTING
Information Patent Grant
Copper alloy suitable for an IC lead pin for a pin grid array provi...
- Patent number 7,727,344
- Issue date Jun 1, 2010
- The Furukawa Electric Co., Ltd.
- Takashi Miyoshi
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Logical CAD navigation for device characteristics evaluation system
- Patent number 7,700,916
- Issue date Apr 20, 2010
- Hitachi High-Technologies Corporation
- Tohru Ando
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Specimen inspection equipment and how to make electron beam absorbe...
- Patent number 7,663,104
- Issue date Feb 16, 2010
- Hitachi High-Technologies Corporation
- Tomoharu Obuki
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting apparatus
- Patent number 7,129,727
- Issue date Oct 31, 2006
- Hitachi High-Technologies Corporation
- Tsutomu Saito
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for manufacturing multilayer printed circuit b...
- Patent number 6,000,124
- Issue date Dec 14, 1999
- Seiko Precision Inc.
- Tsutomu Saito
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Pellicle structure and process for preparation thereof with dissolu...
- Patent number 5,643,654
- Issue date Jul 1, 1997
- Mitsui Petrochemical Industries, Ltd.
- Minoru Fujita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Curable resin coating composition
- Patent number 5,300,558
- Issue date Apr 5, 1994
- Mitsui Petrochemical Industries, Ltd.
- Masayoshi Kurisu
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Pressure responsive switch
- Patent number 4,540,860
- Issue date Sep 10, 1985
- Kabushiki Kaisha Saginomiya Seisakusho
- Takeshi Odashima
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210020422
- Publication date Jan 21, 2021
- Hitachi High-Technologies Corporation
- Mitsuhiro NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device Enabling Facilitated EBSD Detector Ana...
- Publication number 20160163504
- Publication date Jun 9, 2016
- Hitachi High-Technologies Corporation
- Kazuyuki TAKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Method for Adjusting Charged Parti...
- Publication number 20160118218
- Publication date Apr 28, 2016
- Hitachi High-Technologies Corporation
- Kunji SHIGETO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Device
- Publication number 20150179394
- Publication date Jun 25, 2015
- Hitachi High-Technologies Corporation
- Tsutomu Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY PROCESSING DEVICE AND X-RAY PROCESSING METHOD
- Publication number 20130167346
- Publication date Jul 4, 2013
- Seiko Precision Inc.
- Ikuo SHIOZAWA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Probe Storage Container, Prober Apparatus, Probe Arranging Method a...
- Publication number 20110093991
- Publication date Apr 21, 2011
- Hitachi High-Technologies Corporation
- Masanori Gunji
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Testing Method and Semiconductor Tester
- Publication number 20100200749
- Publication date Aug 12, 2010
- Hitachi High-Technologies Corporation
- Tohru ANDO
- G01 - MEASURING TESTING
Information Patent Application
LOGICAL CAD NAVIGATION FOR DEVICE CHARACTERISTICS EVALUATION SYSTEM
- Publication number 20100177954
- Publication date Jul 15, 2010
- Hitachi High-Technologies Corporation
- Tohru ANDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Specimen Inspection Equipment and How to Make the Electron Beam Abs...
- Publication number 20100116986
- Publication date May 13, 2010
- Hitachi High-Technologies Corporation
- Tomoharu OBUKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION APPARATUS
- Publication number 20090250610
- Publication date Oct 8, 2009
- Hitachi High-Technologies Corporation
- Yasuhiko NARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Testing Method and Semiconductor Tester
- Publication number 20080237462
- Publication date Oct 2, 2008
- Hitachi High-Technologies Corporation
- Tohru ANDO
- G01 - MEASURING TESTING
Information Patent Application
Specimen Inspection Equipment and How to Make the Electron Beam Abs...
- Publication number 20080203297
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Tomoharu OBUKI
- G01 - MEASURING TESTING
Information Patent Application
Probe Storage Container, Prober Apparatus, Probe Arranging Method a...
- Publication number 20080204058
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Masanori GUNJI
- G01 - MEASURING TESTING
Information Patent Application
Logical CAD navigation for device characteristics evaluation system
- Publication number 20070124713
- Publication date May 31, 2007
- Tohru Ando
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect inspecting apparatus
- Publication number 20060087330
- Publication date Apr 27, 2006
- Hitachi High-Technologies Corporation
- Tsutomu Saito
- G01 - MEASURING TESTING
Information Patent Application
Copper alloy suitable for an IC lead pin for a pin grid array provi...
- Publication number 20030121573
- Publication date Jul 3, 2003
- Takashi Miyoshi
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Application
Copper alloy suitable for an IC lead pin for a pin grid array provi...
- Publication number 20010051105
- Publication date Dec 13, 2001
- Takashi Miyoshi
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...

Tsutomu Saito

Person

Patents Grantslast 30 patents

Charged particle beam apparatus

Method for adjusting charged particle beam device and adjusting bea...

Charged particle beam device enabling facilitated EBSD detector ana...

X-ray processing device and X-ray processing method

Logical CAD navigation for device characteristics evaluation system

Specimen inspection equipment and how to make the electron beam abs...

Semiconductor testing method and semiconductor tester

Sample inspection apparatus

Probe storage container, prober apparatus, probe arranging method a...

Semiconductor testing method and semiconductor tester

Copper alloy suitable for an IC lead pin for a pin grid array provi...

Logical CAD navigation for device characteristics evaluation system

Specimen inspection equipment and how to make electron beam absorbe...

Defect inspecting apparatus

Method and apparatus for manufacturing multilayer printed circuit b...

Pellicle structure and process for preparation thereof with dissolu...

Curable resin coating composition

Pressure responsive switch

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Beam Device Enabling Facilitated EBSD Detector Ana...

Charged Particle Beam Device and Method for Adjusting Charged Parti...

Charged Particle Device

X-RAY PROCESSING DEVICE AND X-RAY PROCESSING METHOD

Probe Storage Container, Prober Apparatus, Probe Arranging Method a...

Semiconductor Testing Method and Semiconductor Tester

LOGICAL CAD NAVIGATION FOR DEVICE CHARACTERISTICS EVALUATION SYSTEM

Specimen Inspection Equipment and How to Make the Electron Beam Abs...

SAMPLE INSPECTION APPARATUS

Semiconductor Testing Method and Semiconductor Tester

Specimen Inspection Equipment and How to Make the Electron Beam Abs...

Probe Storage Container, Prober Apparatus, Probe Arranging Method a...

Logical CAD navigation for device characteristics evaluation system

Defect inspecting apparatus

Copper alloy suitable for an IC lead pin for a pin grid array provi...

Copper alloy suitable for an IC lead pin for a pin grid array provi...