Tsutomu Sato

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Ninomiya, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 8,618,823
- Issue date Dec 31, 2013
- Hitachi, Ltd.
- Kenichi Tada
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit device, diagnosis method and diagnosis circuit f...
- Patent number 7,559,000
- Issue date Jul 7, 2009
- Hitachi, Ltd.
- Tsutomu Sato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110204908
- Publication date Aug 25, 2011
- Hitachi, Ltd.
- Kenichi Tada
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit device, diagnosis method and diagnosis circuit f...
- Publication number 20070220389
- Publication date Sep 20, 2007
- Hitachi, Ltd.
- Tsutomu Sato
- G01 - MEASURING TESTING