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TSUTOMU SHINOZAKI
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TOKYO, JP
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Patents Grants
last 30 patents
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Patent Grant
Method and apparatus for automatically analyzing trace substance
Patent number
6,470,760
Issue date
Oct 29, 2002
NEC Corporation
Tsutomu Shinozaki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND APPARATUS FOR AUTOMATICALLY ANALYZING TRACE SUBSTANCE
Publication number
20020121148
Publication date
Sep 5, 2002
TSUTOMU SHINOZAKI
G01 - MEASURING TESTING