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Tsutomu Tatematsu
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Kuwana, JP
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Patents Grants
last 30 patents
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Patent Grant
Probe card, having cantilever-type probe and method
Patent number
7,256,591
Issue date
Aug 14, 2007
Fujitsu Limited
Tsutomu Tatematsu
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device provided with fuse and method of disconnecting...
Patent number
6,686,644
Issue date
Feb 3, 2004
Fujitsu Limited
Tsutomu Tatematsu
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Probe card and probe contact method
Publication number
20030098702
Publication date
May 29, 2003
FUJITSU LIMITED
Tsutomu Tatematsu
G01 - MEASURING TESTING
Information
Patent Application
Probe card, semiconductor device testing apparatus, and probe conta...
Publication number
20030098701
Publication date
May 29, 2003
FUJITSU LIMITED
Tsutomu Tatematsu
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device provided with fuse and method of disconnecting...
Publication number
20020153588
Publication date
Oct 24, 2002
Fujitsu Limited of Kawasaki
Tsutomu Tatematsu
H01 - BASIC ELECTRIC ELEMENTS