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Tsuyoshi AKAGI

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Hall element for mitigating current concentration and fabrication m...
    • Patent number 11,029,372
    • Issue date Jun 8, 2021
    • Asahi Kasei Microdevices Corporation
    • Tsuyoshi Akagi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Hall sensor
    • Patent number 10,760,981
    • Issue date Sep 1, 2020
    • Asahi Kasei Microdevices Corporation
    • Tsuyoshi Akagi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Hall element
    • Patent number 10,333,057
    • Issue date Jun 25, 2019
    • Asahi Kasei Microdevices Corporation
    • Tomoya Shoji
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    HALL ELEMENT
    • Publication number 20180277747
    • Publication date Sep 27, 2018
    • ASAHI KASEI MICRODEVICES CORPORATION
    • Tomoya SHOJI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    HALL SENSOR
    • Publication number 20180143090
    • Publication date May 24, 2018
    • ASAHI KASEI MICRODEVICES CORPORATION
    • Tsuyoshi AKAGI
    • G01 - MEASURING TESTING
  • Information Patent Application

    HALL ELEMENT AND FABRICATION METHOD OF HALL SENSOR
    • Publication number 20180143267
    • Publication date May 24, 2018
    • ASAHI KASEI MICRODEVICES CORPORATION
    • Tsuyoshi AKAGI
    • G01 - MEASURING TESTING