Tsuyoshi ATAKA

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Miyagi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measuring probe using terahertz wave
- Patent number 10,088,415
- Issue date Oct 2, 2018
- Advantest Corporation
- Tsuyoshi Ataka
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, test method, calibration device, and calibration me...
- Patent number 9,791,512
- Issue date Oct 17, 2017
- Advantest Corporation
- Shin Masuda
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and circuit module
- Patent number 8,773,141
- Issue date Jul 8, 2014
- Advantest Corporation
- Tsuyoshi Ataka
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, circuit module and manufacturing method
- Patent number 8,729,918
- Issue date May 20, 2014
- Advantest Corporation
- Tsuyoshi Ataka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING APPARATUS, MEASURING METHOD, AND RECORDING MEDIUM
- Publication number 20170082668
- Publication date Mar 23, 2017
- Tsuyoshi ATAKA
- G01 - MEASURING TESTING
Information Patent Application
PROBE
- Publication number 20170074789
- Publication date Mar 16, 2017
- Advantest Corporation
- Tsuyoshi ATAKA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, TEST METHOD, CALIBRATION DEVICE, AND CALIBRATION ME...
- Publication number 20150253388
- Publication date Sep 10, 2015
- Advantest Corporation
- Shin MASUDA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS, CIRCUIT MODULE AND MANUFACTURING METHOD
- Publication number 20120133385
- Publication date May 31, 2012
- Advantest Corporation
- Tsuyoshi Ataka
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND CIRCUIT MODULE
- Publication number 20120119752
- Publication date May 17, 2012
- Advantest Corporation
- Tsuyoshi Ataka
- G01 - MEASURING TESTING