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Tsuyoshi Hirakawa
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Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device
Patent number
8,796,860
Issue date
Aug 5, 2014
Renesas Electronics Corporation
Yuji Tada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
8,436,469
Issue date
May 7, 2013
Renesas Electronics Corporation
Yuji Tada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device
Patent number
8,405,219
Issue date
Mar 26, 2013
Renesas Electronics Corporation
Yuji Tada
Information
Patent Grant
Semiconductor device
Patent number
8,237,287
Issue date
Aug 7, 2012
Renesas Electronics Corporation
Yuji Tada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor integrated circuit device and method of testing same
Patent number
7,965,568
Issue date
Jun 21, 2011
Renesas Electronics Corporation
Kenichi Ushikoshi
G11 - INFORMATION STORAGE
Information
Patent Grant
Power supply voltage detection circuit and semiconductor integrated...
Patent number
7,777,513
Issue date
Aug 17, 2010
NEC Electronics Corporation
Manabu Kitabatake
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE
Publication number
20130140717
Publication date
Jun 6, 2013
RENESAS ELECTRONICS CORPORATION
Yuji Tada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20120241971
Publication date
Sep 27, 2012
RENESAS ELECTRONICS CORPORATION
Yuji Tada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor device
Publication number
20110241216
Publication date
Oct 6, 2011
RENESAS ELECTRONICS CORPORATION
Yuji Tada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND METHOD OF TESTING SAME
Publication number
20090190417
Publication date
Jul 30, 2009
NEC ELECTRONICS CORPORATION
KENICHI USHIKOSHI
G11 - INFORMATION STORAGE
Information
Patent Application
Power supply voltage detection circuit and semiconductor integrated...
Publication number
20090015286
Publication date
Jan 15, 2009
NEC Electronics Corporation
Manabu Kitabatake
G01 - MEASURING TESTING