Tsuyoshi Jouno

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Koganei, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit device with test mode for testing...
- Patent number 5,581,698
- Issue date Dec 3, 1996
- Hitachi, Ltd.
- Yoshiyuki Miwa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device with test mode for testing...
- Patent number 5,228,139
- Issue date Jul 13, 1993
- Hitachi Ltd.
- Yoshiyuki Miwa
- G06 - COMPUTING CALCULATING COUNTING