Tsuyoshi Kubota

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Saga, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of evaluating semiconductor substrate and method of manufact...
- Patent number 10,641,708
- Issue date May 5, 2020
- Sumco Corporation
- Kazutaka Eriguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating metal contamination in boron-doped P-type sili...
- Patent number 9,935,020
- Issue date Apr 3, 2018
- Sumco Corporation
- Shinya Fukushima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of evaluating metal contamination in boron-doped P-type sili...
- Patent number 9,905,481
- Issue date Feb 27, 2018
- Sumco Corporation
- Shinya Fukushima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of evaluating metal contamination in semiconductor wafer and...
- Patent number 9,842,779
- Issue date Dec 12, 2017
- Sumco Corporation
- Kei Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring minority carrier diffusion length and method of...
- Patent number 7,727,783
- Issue date Jun 1, 2010
- Sumco Corporation
- Tsuyoshi Kubota
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EVALUATING SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACT...
- Publication number 20180038797
- Publication date Feb 8, 2018
- SUMCO CORPORATION
- Kazutaka ERIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EVALUATING METAL CONTAMINATION IN BORON-DOPED P-TYPE SILI...
- Publication number 20160079129
- Publication date Mar 17, 2016
- SUMCO CORPORATION
- Shinya FUKUSHIMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EVALUATING METAL CONTAMINATION IN SEMICONDUCTOR WAFER AND...
- Publication number 20150318222
- Publication date Nov 5, 2015
- SUMCO CORPORATION
- Kei MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING MINORITY CARRIER DIFFUSION LENGTH AND METHOD OF...
- Publication number 20070287205
- Publication date Dec 13, 2007
- SUMCO CORPORATION
- Tsuyoshi Kubota
- G01 - MEASURING TESTING