Tsuyoshi Minakawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Timetable planning system and timetable generating method
- Patent number 12,307,395
- Issue date May 20, 2025
- Hitachi, Ltd.
- Yuki Maekawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Train operation support system and train operation support method
- Patent number 12,280,813
- Issue date Apr 22, 2025
- Hitachi, Ltd.
- Ryota Uematsu
- B61 - RAILWAYS
Information Patent Grant
Timetable creation apparatus, timetable creation method, and automa...
- Patent number 12,254,428
- Issue date Mar 18, 2025
- Hitachi, Ltd.
- Tsuyoshi Minakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Timetable modification device and automatic train control system
- Patent number 11,803,930
- Issue date Oct 31, 2023
- Hitachi, Ltd.
- Tsuyoshi Minakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Transport navigation system and transport navigation method
- Patent number 11,754,404
- Issue date Sep 12, 2023
- Hitachi, Ltd.
- Ryota Uematsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Replanned plan output device
- Patent number 11,710,087
- Issue date Jul 25, 2023
- Hitachi, Ltd.
- Akiko Kato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data analysis support apparatus and data analysis support system
- Patent number 11,188,567
- Issue date Nov 30, 2021
- Hitachi, Ltd.
- Yuko Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dimension measuring apparatus and computer readable medium
- Patent number 10,317,203
- Issue date Jun 11, 2019
- Hitachi High-Technologies Corporation
- Tsuyoshi Minakawa
- G01 - MEASURING TESTING
Information Patent Grant
Pattern evaluation device and visual inspection device comprising p...
- Patent number 10,223,784
- Issue date Mar 5, 2019
- Hitachi High-Technologies Corporation
- Hiroyuki Ushiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspecting and measuring device and program
- Patent number 9,858,659
- Issue date Jan 2, 2018
- Hitachi High-Technologies Corporation
- Tsuyoshi Minakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image evaluation apparatus and pattern shape evaluation apparatus
- Patent number 9,830,705
- Issue date Nov 28, 2017
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and defect inspection apparatus
- Patent number 8,953,868
- Issue date Feb 10, 2015
- Hitachi High-Technologies Corporation
- Shinya Murakami
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern measuring apparatus, and pattern measuring method and program
- Patent number 8,942,464
- Issue date Jan 27, 2015
- Hitachi High-Technologies Corporation
- Takuma Shibahara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPERATION PLAN CHANGE ASSISTANCE DEVICE, OPERATION PLAN CHANGE ASSI...
- Publication number 20240308558
- Publication date Sep 19, 2024
- Hitachi, Ltd
- Yuko YAMASHITA
- B61 - RAILWAYS
Information Patent Application
TRAIN OPERATION SUPPORT SYSTEM AND TRAIN OPERATION SUPPORT METHOD
- Publication number 20230311965
- Publication date Oct 5, 2023
- Hitachi, Ltd
- Ryota UEMATSU
- B61 - RAILWAYS
Information Patent Application
SERVICE PLAN CHANGE ASSISTANCE APPARATUS, DECISION MODEL CREATION A...
- Publication number 20230281532
- Publication date Sep 7, 2023
- Hitachi, Ltd
- Tsuyoshi MINAKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Timetable Planning System and Timetable Generating Method
- Publication number 20220358422
- Publication date Nov 10, 2022
- Hitachi, Ltd
- Yuki MAEKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REPLANNED PLAN OUTPUT DEVICE
- Publication number 20220300879
- Publication date Sep 22, 2022
- Hitachi, Ltd
- Akiko KATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Timetable Creation Apparatus, Timetable Creation Method, and Automa...
- Publication number 20220188725
- Publication date Jun 16, 2022
- Hitachi, Ltd
- Tsuyoshi MINAKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Transport Navigation System and Transport Navigation Method
- Publication number 20210003409
- Publication date Jan 7, 2021
- Hitachi, Ltd
- Ryota UEMATSU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Timetable Modification Device and Automatic Train Control System
- Publication number 20200357091
- Publication date Nov 12, 2020
- Hitachi, Ltd
- Tsuyoshi MINAKAWA
- B61 - RAILWAYS
Information Patent Application
Data Analysis Support Apparatus and Data Analysis Support System
- Publication number 20190197047
- Publication date Jun 27, 2019
- Hitachi, Ltd
- Yuko YAMASHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Evaluation Device and Visual Inspection Device Comprising P...
- Publication number 20160063690
- Publication date Mar 3, 2016
- Hitachi High-Technologies Corporation
- Hiroyuki USHIBA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE EVALUATION APPARATUS AND PATTERN SHAPE EVALUATION APPARATUS
- Publication number 20150287201
- Publication date Oct 8, 2015
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Inspecting and Measuring Device and Program
- Publication number 20150228063
- Publication date Aug 13, 2015
- Hitachi High-Technologies Corporation
- Tsuyoshi Minakawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIMENSION MEASURING APPARATUS AND COMPUTER READABLE MEDIUM
- Publication number 20130325397
- Publication date Dec 5, 2013
- Hitachi High-Techologies Corporation
- Tsuyoshi Minakawa
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS
- Publication number 20130322737
- Publication date Dec 5, 2013
- Hitachi High-Technologies Corporation
- Shinya MURAKAMI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MEASURING APPARATUS, AND PATTERN MEASURING METHOD AND PROGRAM
- Publication number 20130223723
- Publication date Aug 29, 2013
- Hitachi High-Technologies Corporation
- Takuma Shibahara
- G01 - MEASURING TESTING
Information Patent Application
Autostereoscopic display
- Publication number 20060132916
- Publication date Jun 22, 2006
- Hitachi Displays, Ltd.
- Michio Oikawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Tsuyoshi Minakawa

Person

Patents Grantslast 30 patents

Timetable planning system and timetable generating method

Train operation support system and train operation support method

Timetable creation apparatus, timetable creation method, and automa...

Timetable modification device and automatic train control system

Transport navigation system and transport navigation method

Replanned plan output device

Data analysis support apparatus and data analysis support system

Dimension measuring apparatus and computer readable medium

Pattern evaluation device and visual inspection device comprising p...

Pattern inspecting and measuring device and program

Image evaluation apparatus and pattern shape evaluation apparatus

Defect inspection method and defect inspection apparatus

Pattern measuring apparatus, and pattern measuring method and program

Patents Applicationslast 30 patents

OPERATION PLAN CHANGE ASSISTANCE DEVICE, OPERATION PLAN CHANGE ASSI...

TRAIN OPERATION SUPPORT SYSTEM AND TRAIN OPERATION SUPPORT METHOD

SERVICE PLAN CHANGE ASSISTANCE APPARATUS, DECISION MODEL CREATION A...

Timetable Planning System and Timetable Generating Method

REPLANNED PLAN OUTPUT DEVICE

Timetable Creation Apparatus, Timetable Creation Method, and Automa...

Transport Navigation System and Transport Navigation Method

Timetable Modification Device and Automatic Train Control System

Data Analysis Support Apparatus and Data Analysis Support System

Pattern Evaluation Device and Visual Inspection Device Comprising P...

IMAGE EVALUATION APPARATUS AND PATTERN SHAPE EVALUATION APPARATUS

Pattern Inspecting and Measuring Device and Program

DIMENSION MEASURING APPARATUS AND COMPUTER READABLE MEDIUM

DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS

PATTERN MEASURING APPARATUS, AND PATTERN MEASURING METHOD AND PROGRAM

Autostereoscopic display