Tsuyoshi Morimoto

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope with measurement function
- Patent number 7,053,371
- Issue date May 30, 2006
- Hitachi High-Technologies Corporation
- Yuuki Ojima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning electron microscope with measurement function
- Publication number 20080109755
- Publication date May 8, 2008
- Yuuki Ojima
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope with measurement function
- Publication number 20060219917
- Publication date Oct 5, 2006
- Yuuki Ojima
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope with measurement function
- Publication number 20040164245
- Publication date Aug 26, 2004
- Yuuki Ojima
- G01 - MEASURING TESTING