Tsuyoshi Onishi

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device and sample production method
- Patent number 10,233,548
- Issue date Mar 19, 2019
- Hitachi High-Technologies Corporation
- Terutaka Nanri
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and method for probe shape processing by ion beam
- Patent number 9,202,672
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and machining method
- Patent number 9,111,721
- Issue date Aug 18, 2015
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen preparation device, and control method in specimen prepara...
- Patent number 8,710,464
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and film thickness measurement method
- Patent number 8,680,465
- Issue date Mar 25, 2014
- Hitachi High-Technologies Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 8,610,060
- Issue date Dec 17, 2013
- Hitachi High-Technologies Corporation
- Suyo Asai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam device and focused ion beam processing method
- Patent number 8,552,397
- Issue date Oct 8, 2013
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
ION BEAM DEVICE AND MACHINING METHOD
- Publication number 20130334034
- Publication date Dec 19, 2013
- Hitachi High-Technologies Corporation
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND SAMPLE PRODUCTION METHOD
- Publication number 20130105302
- Publication date May 2, 2013
- Terutaka Nanri
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
ION BEAM APPARATUS AND ION-BEAM PROCESSING METHOD
- Publication number 20130032714
- Publication date Feb 7, 2013
- Shinya Kitayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused Ion Beam Device and Focused Ion Beam Processing Method
- Publication number 20120235055
- Publication date Sep 20, 2012
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Charged Particle Beam Apparatus and Film Thickness Measurement Method
- Publication number 20120187292
- Publication date Jul 26, 2012
- Hitachi High-Technologies Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN PREPARATION DEVICE, AND CONTROL METHOD IN SPECIMEN PREPARA...
- Publication number 20110309245
- Publication date Dec 22, 2011
- Yuichi Madokoro
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20110297827
- Publication date Dec 8, 2011
- Suyo Asai
- H01 - BASIC ELECTRIC ELEMENTS

Tsuyoshi Onishi

Person

Patents Grantslast 30 patents

Charged particle beam device and sample production method

Apparatus and method for probe shape processing by ion beam

Ion beam device and machining method

Specimen preparation device, and control method in specimen prepara...

Charged particle beam apparatus and film thickness measurement method

Charged particle beam device

Focused ion beam device and focused ion beam processing method

Patents Applicationslast 30 patents

ION BEAM DEVICE AND MACHINING METHOD

CHARGED PARTICLE BEAM DEVICE AND SAMPLE PRODUCTION METHOD

ION BEAM APPARATUS AND ION-BEAM PROCESSING METHOD

Focused Ion Beam Device and Focused Ion Beam Processing Method

Charged Particle Beam Apparatus and Film Thickness Measurement Method

SPECIMEN PREPARATION DEVICE, AND CONTROL METHOD IN SPECIMEN PREPARA...

CHARGED PARTICLE BEAM DEVICE