Tsuyoshi OONISHI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Focused ion beam apparatus
- Patent number 10,056,227
- Issue date Aug 21, 2018
- Hitachi High-Tech Science Corporation
- Tsuyoshi Oonishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder and focused ion beam apparatus
- Patent number 9,947,506
- Issue date Apr 17, 2018
- Hitachi High-Tech Science Corporation
- Toshiyuki Iwahori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control device, charged particle beam apparatus, program and method...
- Patent number 9,934,940
- Issue date Apr 3, 2018
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONTROL DEVICE, CHARGED PARTICLE BEAM APPARATUS, PROGRAM AND METHOD...
- Publication number 20170278673
- Publication date Sep 28, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER AND FOCUSED ION BEAM APPARATUS
- Publication number 20170278667
- Publication date Sep 28, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki IWAHORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM APPARATUS
- Publication number 20170271122
- Publication date Sep 21, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tsuyoshi OONISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170271119
- Publication date Sep 21, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tsuyoshi OONISHI
- H01 - BASIC ELECTRIC ELEMENTS