Tsuyoshi TERAUCHI

Follow

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Film thickness measurement device and method
- Patent number 8,093,913
- Issue date Jan 10, 2012
- IHI Corporation
- Hidetoshi Takimoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE AND METHOD
- Publication number 20090267620
- Publication date Oct 29, 2009
- Hidetoshi TAKIMOTO
- G01 - MEASURING TESTING