Tsuyoshi Toyama

Person

Itami, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of making a semiconductor memory device having error checkin...
- Patent number 5,262,342
- Issue date Nov 16, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Tsuyoshi Toyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Non-volatile memory device capable of storing multi-state data
- Patent number 5,262,984
- Issue date Nov 16, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Noguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having improved error correcting circuit
- Patent number 5,195,099
- Issue date Mar 16, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Osamu Ueda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Nonvolatile semiconductor memory device with reduced variation in s...
- Patent number 5,182,725
- Issue date Jan 26, 1993
- Mitsubishi Denki Kabushiki Kaisha
- Nobuaki Andoh
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having error checking and correcting ci...
- Patent number 5,172,339
- Issue date Dec 15, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Noguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Floating gate type semiconductor memory device
- Patent number 5,107,313
- Issue date Apr 21, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Kohda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nonvolatile semiconductor memory device with reduced variation in s...
- Patent number 5,105,386
- Issue date Apr 14, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Nobuaki Andoh
- G11 - INFORMATION STORAGE
Information Patent Grant
Buffer circuit used in a semiconductor device operating by differen...
- Patent number 5,097,152
- Issue date Mar 17, 1992
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Kohda
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having means for repairing the memory d...
- Patent number 5,058,071
- Issue date Oct 15, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Kohda
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile semiconductor memory device with facility of storing t...
- Patent number 5,021,999
- Issue date Jun 4, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Kohda
- G11 - INFORMATION STORAGE
Information Patent Grant
Buffer circuit used in a semiconductor device operating by differen...
- Patent number 5,003,205
- Issue date Mar 26, 1991
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Kohda
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with error check and correcting function
- Patent number 4,958,352
- Issue date Sep 18, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Noguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Erasable read-only semiconductor memory device
- Patent number 4,949,305
- Issue date Aug 14, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Tsuyoshi Toyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory including a selectively disabled redunancy cir...
- Patent number 4,827,452
- Issue date May 2, 1989
- Mitsubishi Denki Kabushiki Kaisha
- Tsuyoshi Toyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Testable variable-threshold non-volatile semiconductor memory
- Patent number 4,779,272
- Issue date Oct 18, 1988
- Mitsubishi Denki Kabushiki Kaisha
- Kenji Kohda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Field effect transistor with improved withstand voltage characteristic
- Patent number 4,651,186
- Issue date Mar 17, 1987
- Mitsubishi Denki Kabushiki Kaisha
- Makoto Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS

Tsuyoshi Toyama

Person

Patents Grantslast 30 patents

Method of making a semiconductor memory device having error checkin...

Non-volatile memory device capable of storing multi-state data

Semiconductor memory device having improved error correcting circuit

Nonvolatile semiconductor memory device with reduced variation in s...

Semiconductor memory device having error checking and correcting ci...

Floating gate type semiconductor memory device

Nonvolatile semiconductor memory device with reduced variation in s...

Buffer circuit used in a semiconductor device operating by differen...

Semiconductor memory device having means for repairing the memory d...

Non-volatile semiconductor memory device with facility of storing t...

Buffer circuit used in a semiconductor device operating by differen...

Semiconductor memory device with error check and correcting function

Erasable read-only semiconductor memory device

Semiconductor memory including a selectively disabled redunancy cir...

Testable variable-threshold non-volatile semiconductor memory

Field effect transistor with improved withstand voltage characteristic