-
Probe card
-
Patent number 11,959,941
-
Issue date Apr 16, 2024
-
Industrial Technology Research Institute
-
Min-Chieh Chou
-
G01 - MEASURING TESTING
-
-
Multilayer circuit structure
-
Patent number 10,051,737
-
Issue date Aug 14, 2018
-
Industrial Technology Research Institute
-
Meng-Chi Huang
-
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
-
Laminated antenna structure
-
Patent number 10,020,569
-
Issue date Jul 10, 2018
-
Industrial Technology Research Institute
-
Meng-Chi Huang
-
H01 - BASIC ELECTRIC ELEMENTS
-
Metal circuit structure
-
Patent number 9,683,292
-
Issue date Jun 20, 2017
-
Industrial Technology Research Institute
-
Tune-Hune Kao
-
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
-
-
Beam antenna
-
Patent number 9,590,292
-
Issue date Mar 7, 2017
-
Industrial Technology Research Institute
-
Wei-Yu Li
-
H01 - BASIC ELECTRIC ELEMENTS
-
-