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Rishon-Lezion, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Arc detector and a method for detecting arcs
Patent number
10,345,359
Issue date
Jul 9, 2019
Applied Materials Israel Ltd.
Tuvia Biber
G01 - MEASURING TESTING
Information
Patent Grant
System and method for selective zapping
Patent number
9,978,627
Issue date
May 22, 2018
Applied Materials Israel Ltd.
Tuvia Biber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for multi-location zapping
Patent number
9,805,964
Issue date
Oct 31, 2017
Applied Materials Israel Ltd.
Tuvia Biber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inductive modulation of focusing voltage in charged beam system
Patent number
8,507,855
Issue date
Aug 13, 2013
Applied Materials Israel, Ltd.
Tuvia Biber
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR MULTI-LOCATION ZAPPING
Publication number
20170263485
Publication date
Sep 14, 2017
APPLIED MATERIALS ISRAEL LTD.
Tuvia Biber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ARC DETECTOR AND A METHOD FOR DETECTING ARCS
Publication number
20170254847
Publication date
Sep 7, 2017
APPLIED MATERIALS ISRAEL LTD.
Tuvia Biber
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR SELECTIVE ZAPPING
Publication number
20170200627
Publication date
Jul 13, 2017
APPLIED MATERIALS ISRAEL, LTD.
Tuvia Biber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR FAST DISCHARGING OF AN INSPECTED OBJECT
Publication number
20130026362
Publication date
Jan 31, 2013
Tuvia Biber
H01 - BASIC ELECTRIC ELEMENTS