Tuyen K. Tran

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Portland, OR, US

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Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS TO DETECT DEFECTS DURING SEMICONDUCTOR CHIP F...
- Publication number 20240219894
- Publication date Jul 4, 2024
- Intel Corporation
- Santosh Tripathi
- G01 - MEASURING TESTING
Information Patent Application
SACRIFICIAL LAYER FOR SUBSTRATE ANALYSIS
- Publication number 20240055305
- Publication date Feb 15, 2024
- Intel Corporation
- Santosh TRIPATHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER LEVEL ELECTRON BEAM PROBER
- Publication number 20230305057
- Publication date Sep 28, 2023
- Intel Corporation
- Xianghong Tong
- G01 - MEASURING TESTING