Tuyoshi Matumura

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus used for total reflection fluorescent X-ray analysis on a...
- Patent number 5,636,256
- Issue date Jun 3, 1997
- Kabushiki Kaisha Toshiba
- Tuyoshi Matumura
- G01 - MEASURING TESTING