Membership
Tour
Register
Log in
Tyler Bennett Evans
Follow
Person
Edmonds, WA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Automated combined display of measurement data
Patent number
11,843,904
Issue date
Dec 12, 2023
Fluke Corporation
John Neeley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Capture and association of measurement data
Patent number
11,641,536
Issue date
May 2, 2023
Fluke Corporation
John Neeley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated combined display of measurement data
Patent number
10,809,159
Issue date
Oct 20, 2020
Fluke Corporation
John Neeley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Remote sharing of measurement data
Patent number
10,788,401
Issue date
Sep 29, 2020
Fluke Corporation
John Neeley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for determining regions suitable for gas imagin...
Patent number
10,713,781
Issue date
Jul 14, 2020
Fluke Corporation
Matthew F. Schmidt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for determining regions suitable for gas imagin...
Patent number
10,217,210
Issue date
Feb 26, 2019
Fluke Corporation
Matthew F. Schmidt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automatic recording and graphing of measurement data
Patent number
10,088,389
Issue date
Oct 2, 2018
Fluke Corporation
John Neeley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Unified data collection and reporting interface for equipment
Patent number
9,541,472
Issue date
Jan 10, 2017
Fluke Corporation
John Neeley
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Laser illuminated gas imaging device for determining inoperable gas...
Patent number
9,464,984
Issue date
Oct 11, 2016
Fluke Corporation
Matthew F. Schmidt
G01 - MEASURING TESTING
Information
Patent Grant
Insulating article for optical devices
Patent number
9,442,304
Issue date
Sep 13, 2016
Fluke Corporation
Tyler B. Evans
A45 - HAND OR TRAVELLING ARTICLES
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATED COMBINED DISPLAY OF MEASUREMENT DATA
Publication number
20210033497
Publication date
Feb 4, 2021
FLUKE CORPORATION
John Neeley
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR DETERMINING REGIONS SUITABLE FOR GAS IMAGIN...
Publication number
20190172192
Publication date
Jun 6, 2019
FLUKE CORPORATION
Matthew F. Schmidt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LASER ILLUMINATED GAS IMAGING
Publication number
20170024871
Publication date
Jan 26, 2017
FLUKE CORPORATION
Matthew F. Schmidt
G01 - MEASURING TESTING
Information
Patent Application
LASER ILLUMINATED GAS IMAGING
Publication number
20150369730
Publication date
Dec 24, 2015
FLUKE CORPORATION
Matthew F. Schmidt
G01 - MEASURING TESTING
Information
Patent Application
INSULATING ARTICLE FOR OPTICAL DEVICES
Publication number
20150177532
Publication date
Jun 25, 2015
FLUKE CORPORATION
Tyler B. Evans
G02 - OPTICS
Information
Patent Application
CAPTURE AND ASSOCIATION OF MEASUREMENT DATA
Publication number
20140278259
Publication date
Sep 18, 2014
FLUKE CORPORATION
John Neeley
G01 - MEASURING TESTING
Information
Patent Application
UNIFIED DATA COLLECTION AND REPORTING INTERFACE FOR EQUIPMENT
Publication number
20140270546
Publication date
Sep 18, 2014
FLUKE CORPORATION
John Neeley
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC RECORDING AND GRAPHING OF MEASUREMENT DATA
Publication number
20140266765
Publication date
Sep 18, 2014
FLUKE CORPORATION
John Neeley
G01 - MEASURING TESTING
Information
Patent Application
Remote Sharing of Measurement Data
Publication number
20140279443
Publication date
Sep 18, 2014
FLUKE CORPORATION
John Neeley
G01 - MEASURING TESTING
Information
Patent Application
Automated Combined Display of Measurement Data
Publication number
20140267296
Publication date
Sep 18, 2014
FLUKE CORPORATION
John Neeley
G01 - MEASURING TESTING