Tzachi Rafaeli

Person

Givat Shimshit, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Automated selection of X-ray reflectometry measurement locations
- Patent number 7,649,978
- Issue date Jan 19, 2010
- Jordan Valley Semiconductors Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Multifunction X-ray analysis system
- Patent number 7,551,719
- Issue date Jun 23, 2009
- Jordan Valley Semiconductord Ltd
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Detection of dishing and tilting using X-ray fluorescence
- Patent number 7,245,695
- Issue date Jul 17, 2007
- Jordan Valley Applied Radiation Ltd.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
Combined X-ray reflectometer and diffractometer
- Patent number 7,120,228
- Issue date Oct 10, 2006
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Optical alignment of X-ray microanalyzers
- Patent number 7,023,954
- Issue date Apr 4, 2006
- Jordan Valley Applied Radiation Ltd.
- Tzachi Rafaeli
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometry with small-angle scattering measurement
- Patent number 6,895,075
- Issue date May 17, 2005
- Jordan Valley Applied Radiation Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Automated selection of x-ray reflectometry measurement locations
- Publication number 20090074141
- Publication date Mar 19, 2009
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Automated selection of X-ray reflectometry measurement locations
- Publication number 20070274447
- Publication date Nov 29, 2007
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Detection of dishing and tilting using x-ray fluorescence
- Publication number 20060227931
- Publication date Oct 12, 2006
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Application
Multifunction X-ray analysis system
- Publication number 20060062351
- Publication date Mar 23, 2006
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Combined X-ray reflectometer and diffractometer
- Publication number 20060062350
- Publication date Mar 23, 2006
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
Optical alignment of X-ray microanalyzers
- Publication number 20050069090
- Publication date Mar 31, 2005
- JORDAN VALLEY APPLIED RADIATION LTD.
- Tzachi Rafaeli
- G01 - MEASURING TESTING
Information Patent Application
X-ray reflectometry with small-angle scattering measurement
- Publication number 20040156474
- Publication date Aug 12, 2004
- JORDAN VALLEY APPLIED RADIATION LTD.
- Boris Yokhin
- G01 - MEASURING TESTING

Tzachi Rafaeli

Person

Patents Grantslast 30 patents

Automated selection of X-ray reflectometry measurement locations

Multifunction X-ray analysis system

Detection of dishing and tilting using X-ray fluorescence

Combined X-ray reflectometer and diffractometer

Optical alignment of X-ray microanalyzers

X-ray reflectometry with small-angle scattering measurement

Patents Applicationslast 30 patents

Automated selection of x-ray reflectometry measurement locations

Automated selection of X-ray reflectometry measurement locations

Detection of dishing and tilting using x-ray fluorescence

Multifunction X-ray analysis system

Combined X-ray reflectometer and diffractometer

Optical alignment of X-ray microanalyzers

X-ray reflectometry with small-angle scattering measurement