Tzong-Kwang Henry YEH

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Los Gatos, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
SRAM and periphery specialized device sensors
- Patent number 11,164,624
- Issue date Nov 2, 2021
- Synopsys, Inc.
- Tzong-Kwang Henry Yeh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
SRAM and periphery specialized device sensors
- Patent number 10,217,508
- Issue date Feb 26, 2019
- Synopsys, Inc.
- Tzong-Kwang Henry Yeh
- G11 - INFORMATION STORAGE
Information Patent Grant
Negative bias thermal instability stress testing of transistors
- Patent number 9,857,409
- Issue date Jan 2, 2018
- Synopsys, Inc.
- Jamil Kawa
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation of thermal instability stress testing
- Patent number 9,817,059
- Issue date Nov 14, 2017
- Synopsys, Inc.
- Jamil Kawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic static random access memory (SRAM) array characterization u...
- Patent number 9,424,951
- Issue date Aug 23, 2016
- Synopsys, Inc.
- Raymond Tak-Hoi Leung
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SRAM and Periphery Specialized Device Sensors
- Publication number 20190189200
- Publication date Jun 20, 2019
- Synopsys, Inc.
- Tzong-Kwang Henry Yeh
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SRAM and Periphery Specialized Device Sensors
- Publication number 20170330613
- Publication date Nov 16, 2017
- Synopsys, Inc.
- Tzong-Kwang Henry Yeh
- G11 - INFORMATION STORAGE
Information Patent Application
EVALUATION OF THERMAL INSTABILITY STRESS TESTING
- Publication number 20150369855
- Publication date Dec 24, 2015
- Synopsys, Inc.
- Jamil Kawa
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC STATIC RANDOM ACCESS MEMORY (SRAM) ARRAY CHARACTERIZATION
- Publication number 20150063009
- Publication date Mar 5, 2015
- Synopsys, Inc.
- Raymond Tak-Hoi LEUNG
- G11 - INFORMATION STORAGE
Information Patent Application
NEGATIVE BIAS THERMAL INSTABILITY STRESS TESTING FOR STATIC RANDOM...
- Publication number 20150063010
- Publication date Mar 5, 2015
- Synopsys, Inc.
- Jamil KAWA
- G11 - INFORMATION STORAGE
Information Patent Application
NEGATIVE BIAS THERMAL INSTABILITY STRESS TESTING OF TRANSISTORS
- Publication number 20150061726
- Publication date Mar 5, 2015
- Synopsys, Inc.
- Jamil KAWA
- G01 - MEASURING TESTING