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Tzu-Chia LIU
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HEFEI, CN
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Patents Grants
last 30 patents
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Patent Grant
Tester and method for calibrating probe card and device under testi...
Patent number
11,852,657
Issue date
Dec 26, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
You-Hsien Lin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND APPARATUS OF CONTROLLING SEMICONDUCTOR MANUFACTURING DEV...
Publication number
20230053815
Publication date
Feb 23, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC
TZU-HSUAN LIU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TESTER AND METHOD FOR CALIBRATING PROBE CARD AND DEVICE UNDER TESTI...
Publication number
20210270868
Publication date
Sep 2, 2021
Changxin Memory Technologies, Inc.
You-Hsien LIN
G01 - MEASURING TESTING