Uday Nayak

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Compliance control methods and apparatuses
- Patent number 8,519,728
- Issue date Aug 27, 2013
- FormFactor, Inc.
- Sun Yalei
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving motion times of a stage
- Patent number 8,310,195
- Issue date Nov 13, 2012
- FormFactor, Inc.
- Sun Yalei
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for improving motion times of a stage
- Patent number 8,120,304
- Issue date Feb 21, 2012
- FormFactor, Inc.
- Sun Yalei
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and apparatuses for improved positioning in a probing system
- Patent number 7,852,097
- Issue date Dec 14, 2010
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for improved stabilization in a probing system
- Patent number 7,622,939
- Issue date Nov 24, 2009
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for improved positioning in a probing system
- Patent number 7,368,929
- Issue date May 6, 2008
- Electroglas, Inc.
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Grant
Method for probing impact sensitive and thin layered substrate
- Patent number 7,362,116
- Issue date Apr 22, 2008
- Electroglas, Inc.
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for improved stabilization in a probing system
- Patent number 7,352,198
- Issue date Apr 1, 2008
- Electroglas, Inc.
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for cleaning a probe card
- Patent number 7,345,466
- Issue date Mar 18, 2008
- Electroglas, Inc.
- Michael Vogtmann
- B08 - CLEANING
Information Patent Grant
Precision scanning apparatus and method with fixed and movable guid...
- Patent number 6,363,809
- Issue date Apr 2, 2002
- Nikon Corporation, Japan
- W. Thomas Novak
- G05 - CONTROLLING REGULATING
Information Patent Grant
Precision scanning apparatus and method with fixed and movable guid...
- Patent number 6,134,981
- Issue date Oct 24, 2000
- Nikon Research Corporation of America
- W. Thomas Novak
- G05 - CONTROLLING REGULATING
Information Patent Grant
Precision motion stage with single guide beam and follower stage
- Patent number 5,996,437
- Issue date Dec 7, 1999
- Nikon Corporation
- W. Thomas Novak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Precision motion stage with single guide beam and follower stage
- Patent number 5,623,853
- Issue date Apr 29, 1997
- Nikon Precision Inc.
- W. Thomas Novak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR IMPROVING MOTION TIMES OF A STAGE
- Publication number 20120146569
- Publication date Jun 14, 2012
- Sun Yalei
- G05 - CONTROLLING REGULATING
Information Patent Application
COMPLIANCE CONTROL METHODS AND APPARATUSES
- Publication number 20100148814
- Publication date Jun 17, 2010
- Sun Yalei
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVING MOTION TIMES OF A STAGE
- Publication number 20100148715
- Publication date Jun 17, 2010
- Sun Yalei
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR PROBING IMPACT SENSITVE AND THIN LAYERED SUBSTRATE
- Publication number 20080150559
- Publication date Jun 26, 2008
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUSES FOR IMPROVED POSITIONING IN A PROBING SYSTEM
- Publication number 20080150565
- Publication date Jun 26, 2008
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUSES FOR IMPROVED STABILIZATION IN A PROBING SYSTEM
- Publication number 20080100321
- Publication date May 1, 2008
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatuses for improved stabilization in a probing system
- Publication number 20070164760
- Publication date Jul 19, 2007
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Application
Methods and apparatuses for improved positioning in a probing system
- Publication number 20070164762
- Publication date Jul 19, 2007
- Uday Nayak
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for cleaning a probe card
- Publication number 20070028946
- Publication date Feb 8, 2007
- Michael Vogtmann
- B08 - CLEANING

Person

Patents Grantslast 30 patents

Compliance control methods and apparatuses

Method for improving motion times of a stage

Method for improving motion times of a stage

Methods and apparatuses for improved positioning in a probing system

Methods and apparatuses for improved stabilization in a probing system

Methods and apparatuses for improved positioning in a probing system

Method for probing impact sensitive and thin layered substrate

Methods and apparatuses for improved stabilization in a probing system

Method and apparatus for cleaning a probe card

Precision scanning apparatus and method with fixed and movable guid...

Precision scanning apparatus and method with fixed and movable guid...

Precision motion stage with single guide beam and follower stage

Precision motion stage with single guide beam and follower stage

Patents Applicationslast 30 patents

METHOD FOR IMPROVING MOTION TIMES OF A STAGE

COMPLIANCE CONTROL METHODS AND APPARATUSES

METHOD FOR IMPROVING MOTION TIMES OF A STAGE

METHOD FOR PROBING IMPACT SENSITVE AND THIN LAYERED SUBSTRATE

METHODS AND APPARATUSES FOR IMPROVED POSITIONING IN A PROBING SYSTEM

METHODS AND APPARATUSES FOR IMPROVED STABILIZATION IN A PROBING SYSTEM

Methods and apparatuses for improved stabilization in a probing system

Methods and apparatuses for improved positioning in a probing system

Method and apparatus for cleaning a probe card