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Udo Verkerk
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Toronto, Ontario, CA
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Patents Grants
last 30 patents
Information
Patent Grant
Surface layer disruption and ionization utilizing an extreme ultrav...
Patent number
10,665,446
Issue date
May 26, 2020
Rapiscan Systems, Inc.
Udo H. Verkerk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dopants for the detection of nitrates
Patent number
10,345,264
Issue date
Jul 9, 2019
SMITHS DETECTION MONTREAL INC.
Jan Hendrikse
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
ION IMPLANTATION SYSTEM AND METHOD FOR IMPLANTING ALUMINUM USING NO...
Publication number
20240035148
Publication date
Feb 1, 2024
Axcelis Technologies, Inc.
Neil Colvin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Sensitivity Traps for Electronic Trace Detection
Publication number
20220011286
Publication date
Jan 13, 2022
Rapiscan Systems, Inc.
Udo H. Verkerk
G01 - MEASURING TESTING
Information
Patent Application
Surface Layer Disruption and Ionization Utilizing an Extreme Ultrav...
Publication number
20190228959
Publication date
Jul 25, 2019
Rapiscan Systems, Inc.
Udo H. Verkerk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR SUBSTANCE DETECTION USING POSITIVE DOPANTS
Publication number
20180356320
Publication date
Dec 13, 2018
Rapiscan Systems, Inc.
Vladimir Romanov
G01 - MEASURING TESTING
Information
Patent Application
DOPANTS FOR THE DETECTION OF NITRATES
Publication number
20180136165
Publication date
May 17, 2018
Jan Hendrikse
G01 - MEASURING TESTING